欢迎访问ic37.com |
会员登录 免费注册
发布采购

EPM7192SQC160-10 参数 Datasheet PDF下载

EPM7192SQC160-10图片预览
型号: EPM7192SQC160-10
PDF下载: 下载PDF文件 查看货源
内容描述: 可编程逻辑器件系列 [Programmable Logic Device Family]
分类和应用: 可编程逻辑器件输入元件LTE时钟
文件页数/大小: 62 页 / 1087 K
品牌: ALTERA [ ALTERA CORPORATION ]
 浏览型号EPM7192SQC160-10的Datasheet PDF文件第18页浏览型号EPM7192SQC160-10的Datasheet PDF文件第19页浏览型号EPM7192SQC160-10的Datasheet PDF文件第20页浏览型号EPM7192SQC160-10的Datasheet PDF文件第21页浏览型号EPM7192SQC160-10的Datasheet PDF文件第23页浏览型号EPM7192SQC160-10的Datasheet PDF文件第24页浏览型号EPM7192SQC160-10的Datasheet PDF文件第25页浏览型号EPM7192SQC160-10的Datasheet PDF文件第26页  
MAX 7000 Programmable Logic Device Family Data Sheet  
For more information, see Application Note 39 (IEEE 1149.1 (JTAG)  
Boundary-Scan Testing in Altera Devices).  
f
All MAX 7000 devices contain a programmable security bit that controls  
access to the data programmed into the device. When this bit is  
programmed, a proprietary design implemented in the device cannot be  
copied or retrieved. This feature provides a high level of design security  
because programmed data within EEPROM cells is invisible. The security  
bit that controls this function, as well as all other programmed data, is  
reset only when the device is reprogrammed.  
Design Security  
Each MAX 7000 device is functionally tested. Complete testing of each  
programmable EEPROM bit and all internal logic elements ensures 100%  
programming yield. AC test measurements are taken under conditions  
equivalent to those shown in Figure 10. Test patterns can be used and then  
erased during early stages of the production flow.  
Generic Testing  
Figure 10. MAX 7000 AC Test Conditions  
Power supply transients can affect AC  
measurements. Simultaneous  
transitions of multiple outputs should be  
VCC  
avoided for accurate measurement.  
Threshold tests must not be performed  
under AC conditions. Large-amplitude,  
fast ground-current transients normally  
occur as the device outputs discharge  
the load capacitances. When these  
transients flow through the parasitic  
inductance between the device ground  
pin and the test system ground,  
464 Ω  
[703 ]  
Device  
Output  
To Test  
System  
250  
C1 (includes JIG  
capacitance)  
[8.06  
]
KΩ  
significant reductions in observable  
noise immunity can result. Numbers in  
brackets are for 2.5-V devices and  
outputs. Numbers without brackets are  
for 3.3-V devices and outputs.  
Device input  
rise and fall  
times < 3 ns  
MAX 7000 and MAX 7000E devices in QFP packages with 100 or more  
pins are shipped in special plastic carriers to protect the QFP leads. The  
carrier is used with a prototype development socket and special  
programming hardware available from Altera. This carrier technology  
makes it possible to program, test, erase, and reprogram a device without  
exposing the leads to mechanical stress.  
QFP Carrier &  
Development  
Socket  
For detailed information and carrier dimensions, refer to the QFP Carrier  
& Development Socket Data Sheet.  
f
1
MAX 7000S devices are not shipped in carriers.  
22  
Altera Corporation  
 复制成功!