Chapter 11: SEU Mitigation in the Cyclone III Device Family
Automated SEU Detection
11–3
In user mode, Cyclone III device family supports the
CHANGE_EDREG
JTAG instruction,
which allows you to write to the 32-bit storage register. You can use Jam
™
STAPL files
(.jam) to automate the testing and verification process. This instruction can only be
executed when the device is in user mode, and it is a powerful design feature that
enables you to dynamically verify the CRC functionality in-system without having to
reconfigure the device. You can then switch to use the CRC circuit to check for real
errors induced by an SEU.
lists the
CHANGE_EDREG
JTAG instructions.
Table 11–1. CHANGE_EDREG JTAG Instruction
JTAG Instruction
CHANGE_EDREG
Instruction Code
00 0001 0101
Description
This instruction connects the 32-bit CRC storage register between
TDI
and
TDO.
Any precomputed CRC is loaded into the CRC storage register to test the operation
of the error detection CRC circuitry at the
CRC_ERROR
pin.
1
After the test completes, to clear the CRC error and restore the original CRC value,
power cycle the device or perform the following procedure:
1. After the configuration completes, use JTAG instruction
CHANGE_EDREG
to shift out
the correct precomputed CRC value and load the wrong CRC value to the CRC
storage register. The
CRC_ERROR
pin will be asserted and shows that a CRC error is
detected.
2. Use JTAG instruction
CHANGE_EDREG
to shift in the correct precomputed CRC value.
The
CRC_ERROR
pin is deasserted and shows that the error detection CRC circuitry
is working.
Automated SEU Detection
Cyclone III device family offers on-chip circuitry for automated checking of SEU
detection. Applications that require the device to operate error-free at high elevations
or in close proximity to earth’s North or South Pole require periodic checks to ensure
continued data integrity. The error detection cyclic redundancy code feature
controlled by the
Device and Pin Options
dialog box in the Quartus II software uses a
32-bit CRC circuit to ensure data reliability and is one of the best options for
mitigating SEU.
You can implement the error detection CRC feature with existing circuitry in
Cyclone III device family, eliminating the need for external logic. The CRC is
computed by the device during configuration and checked against an automatically
computed CRC during normal operation. The
CRC_ERROR
pin reports a soft error when
configuration CRAM data is corrupted, and you must decide whether to reconfigure
the FPGA by strobing the
nCONFIG
pin low or ignore the error.
CRC_ERROR Pin
A specific error detection pin,
CRC_ERROR,
is required to monitor the results of the error
detection circuitry during user mode.
December 2011
Altera Corporation
Cyclone III Device Handbook
Volume 1
ALTERA [ ALTERA CORPORATION ]
