AS29CF160T-55TIN
AS29CF160B-55TIN
AC Characteristics
Read Only Operations
Parameter Symbols
Description
Test Setup
Speed
Unit
-55
JEDEC
Std
Read Cycle Time (Note 1)
tAVAV
tRC
Min.
55
ns
ns
= VIL
= VIL
CE
OE
Max.
55
tAVQV
tACC
Address to Output Delay
tELQV
tGLQV
tCE
Max.
Max.
Min.
55
25
0
ns
ns
ns
Chip Enable to Output Delay
Output Enable to Output Delay
= VIL
OE
tOE
Read
tOEH
Output Enable Hold Time (Note 1)
Toggle and
ns
Min.
Max.
Max.
10
20
20
Polling
Data
tEHQZ
tGHQZ
tDF
ns
ns
Chip Disable to Output High Z (Notes 1)
Output Disable to Output High Z (Notes 1)
tDF
Output Hold Time from Addresses,
Whichever Occurs First (Note 1)
or ,
CE OE
tAXQX
tOH
Min.
0
ns
Notes:
1. Not 100% tested.
2. See Test Conditions and Test Setup for test specifications.
Timing Waveforms for Read Only Operation
t
RC
Addresses
Addresses Stable
t
ACC
CE
OE
t
DF
t
OE
t
OEH
WE
t
CE
t
OH
High-Z
High-Z
Output
Output Valid
RESET
RY/BY
0V
Confidential
- 25 of 41 -
Rev.1.0 July 2019
ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
