AS29CF160T-55TIN
AS29CF160B-55TIN
DC Characteristics
CMOS Compatible
Parameter
Symbol
ILI
Parameter Description
Test Description
Min.
Typ.
Max.
Unit
Input Leakage Current
A9 Input Load Current
Output Leakage Current
VIN = VSS to VCC. VCC = VCC Max
VCC = VCC Max, A9 =11.5V
±2.0
35
µA
µA
µA
mA
ILIT
ILO
VOUT = VSS to VCC. VCC = VCC Max
±2.0
40
ICC1
VCC Active Read Current
(Notes 1, 2)
5 MHz
1 MHz
8
= VIL,
= VIH
CE
OE
OE
Byte Mode
1.6
8
5 MHz
1 MHz
12
50
10
= VIL,
= VIH
=VIH
CE
2.4
Word Mode
ICC2
VCC Active Write (Program/Erase)
Current (Notes 2, 3, 4)
30
50
mA
uA
= VIL,
= VIH,
CE
OE
6
150
= VCC ± 0.5V
RESET
CE
ICC3
ICC4
VCC Standby Current (Note 2)
= VCC or Float
WP
VCC Standby Current During Reset
(Note 2)
6
150
µA
= VSS ± 0.5V
RESET
= VCC or Float
WP
VIL
VIH
VID
Input Low Level
-0.5
3.3
9.5
0.8
VCC + 0.5
11.5
V
V
V
Input High Level
Voltage for Autoselect and
Temporary Unprotect Sector
Output Low Voltage
Output High Voltage
VCC = 5.0 V
10.5
VOL
VOH1
VOH2
VLKO
IOL = 6.0mA, VCC = VCC Min
IOH = -2.5 mA, VCC = VCC Min
IOH = -100 µA, VCC = VCC Min
0.45
4.1
V
V
V
V
0.8 x VCC
VCC - 0.4
3.1
Low VCC Lockout Voltage (Note 4)
3.6
Notes:
1. The ICC current listed is typically less than 2mA/MHz, with
OE
2. Maximum ICC specifications are tested with VCC = VCC max.
at VIH. Typical VCC is 5.0V.
3. ICC active while Embedded Algorithm (program or erase) is in progress.
4. Not 100% tested.
Confidential
- 23 of 41 -
Rev.1.0 July 2019
ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
