T9000
Preliminary Data Sheet
November 2000
ISDN Network Termination Node (NTN) Device
4 Pin Information (continued)
Table 6. Comparators (6)
Pin Name Pin # Type*
Pin Description
INP0
INN0
INP1
INN1
INP2
INN2
46
45
48
47
50
49
I
I
I
I
I
I
Input Positive, Comparator 0. Connect to 5 V via 1 kΩ.
Input Negative, Comparator 0. Connect to GND via 1 kΩ.
Input Positive, Comparator 1. Connect to 5 V via 1 kΩ.
Input Negative, Comparator 1. Connect to GND via 1 kΩ.
Input Positive, Comparator 2. Connect to 5 V via 1 kΩ.
Input Negative, Comparator 2. Connect to GND via 1 kΩ.
* I = input.
Table 7. JTAG Pins (4)
Pin Name Pin #
Type*
IU
(O)
Pin Description
JTCK
41
JTAG TAP Clock. It is recommended that this pin be externally pulled to VDD
during normal operation. Internal 100 kΩ pull-up.
(C1536)
15.36 MHz System Clock. When the TEST pin is asserted, this pin assumes
the alternate function C1536. This output is a buffered version of the internal
15.36 MHz system clock that is used by the NTN device.
JTMS
(TCI)
42
IU
(O)
JTAG TAP Mode Select. This pin is externally pulled to VDD through approxi-
mately 20 kΩ. Internal 100 kΩ pull-up.
Test Control In. When the TEST pin is asserted, this pin assumes the alternate
function TCI. This pin is used for factory testing.
Note: When in test mode, TCI must not be pulled low by the user when not being
actively driven.
JTDI
(TDI)
40
35
IU
O
JTAG Serial Data Input. This pin is internally pulled to VDD through approxi-
mately 20 kΩ. Internal 100 kΩ pull-up.
Test Data In. When the TEST pin is asserted, the GPIO1.7 pin assumes the
alternate function TDI. This pin is used for factory testing.
JTDO
(TDO)
JTAG Serial Data Output.
Test Data Out. When the TEST pin is asserted, this pin assumes the alternate
function TDO. This pin is used for factory testing.
* I = input, O = output, IU = input with an internal 100 kΩ pull-up.
Lucent Technologies Inc.
13
AGERE [ AGERE SYSTEMS ]
