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OR3T55-6BA256 参数 Datasheet PDF下载

OR3T55-6BA256图片预览
型号: OR3T55-6BA256
PDF下载: 下载PDF文件 查看货源
内容描述: 3C和3T现场可编程门阵列 [3C and 3T Field-Programmable Gate Arrays]
分类和应用: 现场可编程门阵列可编程逻辑
文件页数/大小: 210 页 / 4391 K
品牌: AGERE [ AGERE SYSTEMS ]
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Data Sheet  
June 1999  
ORCA Series 3C and 3T FPGAs  
operation or written during test operation. The data for  
all of the I/Os is captured simultaneously into the BSR,  
allowing them to be shifted-out TDO to the test host.  
Since each I/O buffer in the PICs is bidirectional, two  
pieces of data are captured for each I/O pad: the value  
at the I/O pad and the value of the 3-state control sig-  
nal. For preload operation, data is written from the BSR  
to all of the I/Os simultaneously.  
Special Function Blocks (continued)  
The external test (EXTEST) instruction allows the inter-  
connections between ICs in a system to be tested for  
opens and stuck-at faults. If an EXTEST instruction is  
performed for the system shown in Figure 36, the con-  
nections between U1 and U2 (shown by nets a, b, and  
c) can be tested by driving a value onto the given nets  
from one device and then determining whether the  
same value is seen at the other device. This is deter-  
mined by shifting 2 bits of data for each pin (one for the  
output value and one for the 3-state value) through the  
BSR until each one aligns to the appropriate pin. Then,  
based upon the value of the 3-state signal, either the  
I/O pad is driven to the value given in the BSR, or the  
BSR is updated with the input value from the I/O pad,  
which allows it to be shifted out TDO.  
There are five ORCA-defined instructions. The PLC  
scan rings 1 and 2 (PSR1, PSR2) allow user-defined  
internal scan paths using the PLC latches/FFs. The  
RAM_Write Enable (RAM_W) instruction allows the  
user to serially configure the FPGA through TDI. The  
RAM_Read Enable (RAM_R) allows the user to read  
back RAM contents on TDO after configuration. The  
IDCODE instruction allows the user to capture a 32-bit  
identification code that is unique to each device and  
serially output it at TDO. The IDCODE format is shown  
in Table 14.  
The SAMPLE/PRELOAD instruction is useful for sys-  
tem debugging and fault diagnosis by allowing the data  
at the FPGA’s I/Os to be observed during normal  
Table 14.  
Boundary-Scan ID Code  
Version  
(4 bits)  
Part*  
(10 bits)  
Family  
(6 bits)  
Manufacturer  
LSB  
(1 bit)  
Device  
(11 bits)  
OR3T20  
OR3T30  
0000  
0000  
0000  
0000  
0000  
0000  
0011000000 110000  
0111000000 110000  
0100100000 110000  
0110100000 110000  
0011100000 110000  
0000010000 110000  
00000011101  
1
1
1
1
1
1
00000011101  
00000011101  
00000011101  
00000011101  
00000011101  
OR3C/T55  
OR3C/T80  
OR3T125  
OR3T165  
* PLC array size of FPGA, reverse bit order.  
Note: Table assumes version 0.  
Lucent Technologies Inc.  
59  
 
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