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OR3T55-6BA256 参数 Datasheet PDF下载

OR3T55-6BA256图片预览
型号: OR3T55-6BA256
PDF下载: 下载PDF文件 查看货源
内容描述: 3C和3T现场可编程门阵列 [3C and 3T Field-Programmable Gate Arrays]
分类和应用: 现场可编程门阵列可编程逻辑
文件页数/大小: 210 页 / 4391 K
品牌: AGERE [ AGERE SYSTEMS ]
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Data Sheet  
June 1999  
ORCA Series 3C and 3T FPGAs  
Special Function Blocks (continued)  
D[7:0]  
D[7:0]  
TDI  
TDO  
TDI  
TDO  
TDO  
ORCA  
SERIES  
FPGA  
ORCA  
SERIES  
FPGA  
LUCENT  
BOUNDARY-  
SCAN  
MASTER  
CE  
TMS0  
TCK  
TMS  
TCK  
TMS  
TCK  
MICRO-  
PROCESSOR  
(DUT)  
(DUT)  
RA  
R/W  
DAV  
INT  
SP  
(BSM)  
TDI  
INTR  
TDI  
TDO  
ORCA  
SERIES  
FPGA  
TMS  
TCK  
(DUT)  
5-6765(F)  
Figure 37. Boundary-Scan Interface  
Table 13. Boundary-Scan Instructions  
The boundary-scan support circuit shown in Figure 37  
is the 497AA Boundary-Scan Master (BSM). The BSM  
off-loads tasks from the test host to increase test  
throughput. To interface between the test host and the  
DUTs, the BSM has a general microprocessor interface  
and provides parallel-to-serial/serial-to-parallel conver-  
sion, as well as three 8K data buffers. The BSM also  
increases test throughput with a dedicated automatic  
test-pattern generator and with compression of the test  
response with a signature analysis register. The PC-  
based boundary-scan test card/software allows a user  
to quickly prototype a boundary-scan test setup.  
Code  
000  
001  
010  
011  
100  
101  
110  
111  
Instruction  
EXTEST  
PLC Scan Ring 1 (PSR1)/USERCODE  
RAM Write (RAM_W)  
IDCODE  
SAMPLE/PRELOAD  
PLC Scan Ring 2 (PSR2)  
RAM Read (RAM_R)  
BYPASS  
Boundary-Scan Instructions  
The ORCA Series boundary-scan circuitry is used for  
three mandatory IEEE 1149.1/D1 tests (EXTEST,  
SAMPLE/PRELOAD, BYPASS), the optional IEEE  
1149.1/D1 IDCODE instruction, and five ORCA-defined  
instructions. The 3-bit wide instruction register sup-  
ports the nine instructions listed in Table 13, where the  
use of PSR1 or USERCODE is selectable by a bit  
stream option.  
58  
Lucent Technologies Inc.