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EVAL-ADXL362Z 参数 Datasheet PDF下载

EVAL-ADXL362Z图片预览
型号: EVAL-ADXL362Z
PDF下载: 下载PDF文件 查看货源
内容描述: 微功耗, 3轴,2G / 4G / 8G数字输出MEMS加速度计 [Micropower, 3-Axis, 2g/4g/8g Digital Output MEMS Accelerometer]
分类和应用:
文件页数/大小: 44 页 / 1122 K
品牌: ADI [ ADI ]
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ADXL36±  
Data Sheet  
ADDITIONAL FEATURES  
FREE FALL DETECTION  
SYNCHRONIZED DATA SAMPLING  
Many digital output accelerometers include a built-in free fall  
detection feature. In the ADXL362, this function can be imple-  
mented using the inactivity interrupt. Refer to the Applications  
Information section for more details, including suggested  
threshold and timing values.  
For applications that require a precisely timed acceleration  
measurement, the ADXL362 features an option to synchronize  
acceleration sampling to an external trigger.  
SELF TEST  
The ADXL362 incorporates a self test feature that effectively  
tests its mechanical and electronic systems simultaneously.  
When the self test function is invoked, an electrostatic force is  
applied to the mechanical sensor. This electrostatic force moves the  
mechanical sensing element in the same manner as acceleration,  
and it is additive to the acceleration experienced by the device.  
This added electrostatic force results in an output change on all  
three axes.  
EXTERNAL CLOCK  
The ADXL362 has a built-in 51.2 kHz (typical) clock that, by  
default, serves as the time base for internal operations.  
ODR and bandwidth scale proportionally with the clock. The  
ADXL362 provides a discrete number of options for ODR, such  
as 100 Hz, 50 Hz, 25 Hz, and so forth, in factors of 2, (see the  
Filter Control Register section for a complete listing). To  
achieve data rates other than those provided, an external clock  
can be used at the appropriate clock frequency. The output data  
rate scales with the clock frequency, as shown in Equation 3.  
USER REGISTER PROTECTION  
The ADXL362 includes user register protection for single event  
upsets (SEUs). An SEU is a change of state caused by ions or  
electromagnetic radiation striking a sensitive node in a micro-  
electronic device. The state change is a result of the free charge  
created by ionization in or close to an important node of a logic  
element (for example, a memory bit). The SEU, itself, is not con-  
sidered permanently damaging to transistor or circuit functionality,  
but it can create erroneous register values. The ADXL362 registers  
that are protected from SEU are Register 0x20 to Register 0x2E.  
f
ODRACTUAL = ODRSELECTED  
×
(3)  
51.2 kHz  
For example, to achieve an 80 Hz ODR, select the 100 Hz ODR  
setting and provide a clock frequency that is 80% of nominal, or  
41.0 kHz.  
The ADXL362 can operate with external clock frequencies  
ranging from the nominal 51.2 kHz down to 25.6 kHz to allow  
the user to achieve any desired output data rate.  
SEU protection is implemented via a 99-bit error correcting  
(Hamming-type) code that detects both single- and double-bit  
errors. The check bits are recomputed any time a write to any of  
the protected registers occurs. At any time, if the stored version  
of the check bits is not in agreement with the current check bit  
calculation, the ERR_USER_REGS status bit is set.  
Alternatively, an external clock can be used to improve clock  
frequency accuracy. The distribution of clock frequencies  
among a sampling of >1000 parts has a standard deviation of  
approximately 3%. To achieve tighter tolerances, a more  
accurate clock can be provided externally.  
The SEU bit in the status register is set on power-up prior to  
device configuration; it clears upon the first register write to  
that device.  
Bandwidth automatically scales to ½ or ¼ of the ODR (based  
on the HALF_BW setting), and this ratio is preserved, regardless  
of clock frequency. Power consumption also scales with clock  
frequency: higher clock rates increase power consumption.  
Figure 34 shows how power consumption varies with clock rate.  
3.0  
TEMPERATURE SENSOR  
The ADXL362 includes an integrated temperature sensor that  
can monitor internal system temperature or improve the tempera-  
ture stability of the device via calibration. For example, acceleration  
outputs vary with temperature at a rate of 0.5 mg/°C (typical),  
but the relationship to temperature is repeatable and can be  
calibrated.  
2.5  
2.0  
1.5  
1.0  
0.5  
To use the temperature sensor to monitor absolute temperature,  
it is recommended that its initial bias (its output at some known  
temperature) is measured and calibrated.  
V
V
V
= 1.6V  
= 2.0V  
= 3.5V  
S
S
S
0
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
EXTERNAL CLOCK FREQUENCY (kHz)  
Figure 34. Current Consumption vs. External Clock Rate  
Rev. PrA Page 4 of 8  
 
 
 
 
 
 
 
 
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