AD7701
P aram eter
A, S Versions2
B, T Versions2
Units
Test Conditions/Com m ents
POWER REQUIREMENT S8
Power Supply Voltages
Analog Positive Supply (AVDD
Digital Positive Supply (DVDD
)
)
)
4.5/5.5
4.5/5.5
V min/V max
V min/V max
V min/V max
V min/V max
4.5/AVDD
–4.5/–5.5
–4.5/–5.5
4.5/AVDD
–4.5/–5.5
–4.5/–5.5
Analog Negative Supply (AVSS
Digital Negative Supply (DVSS
Calibration Memory Retention
Power Supply Voltage
)
2.0
2.0
V min
DC Power Supply Currents8
Analog Positive Supply (AIDD
Digital Positive Supply (DIDD
Analog Negative Supply (AISS
Digital Negative Supply (DISS
Power Supply Rejection9
Positive Supplies
)
)
)
)
3.2
1.5
3.2
0.1
3.2
1.5
3.2
0.1
mA max
mA max
mA max
mA max
T ypically 2 mA
T ypically 1 mA
T ypically 2 mA
T ypically 0.03 mA
70
75
70
75
dB typ
dB typ
Negative Supplies
Power Dissipation
Normal Operation
40
40
mW max
SLEEP = Logic 1,
T ypically 25 mW
SLEEP = Logic 0,
T ypically 10 µW
Standby Operation10
20 (40 S Version)
20 (40 T Version)
µW max
NOT ES
11T he AIN pin presents a very high impedance dynamic load which varies with clock frequency.
12T emperature ranges are as follows: A, B Versions; –40°C to +85°C; S, T Versions; –55°C to +125°C.
13Apply after calibration at the temperature of interest. Full-scale error applies for both unipolar and bipolar input ranges.
14T otal drift over the specified temperature range since calibration at power-up at +25 °C. T his is guaranteed by design and/or characterization. Recalibration at any
temperature will remove these errors.
15In unipolar mode the offset can have a negative value (–VREF) such that the unipolar mode can mimic bipolar mode operation.
16T he specifications for input overrange and for input span apply additional constraints on the offset calibration range.
17For unipolar mode, input span is the difference between full scale and zero scale. For bipolar mode, input span is the difference between positive and negative
full-scale points. When using less than the maximum input span, the span range may be placed anywhere within the range of ±(VREF +0.1)
18All digital outputs unloaded. All digital inputs at 5 V CMOS levels.
19Applies in 0.1 Hz to 10 Hz bandwidth. PSRR at 60 Hz will exceed 120 dB due to the digital filter.
10CLKIN is stopped. All digital inputs are grounded.
Specifications subject to change without notice.
ABSO LUTE MAXIMUM RATINGS1
Industrial Cerdip (A, B Versions) . . . . . . . –40°C to +85°C
(T A = +25°C unless otherwise noted)
Extended Cerdip (S, T Versions) . . . . . . –55°C to +125°C
Storage T emperature Range . . . . . . . . . . . –65°C to +150°C
Lead T emperature (Soldering, 10 secs) . . . . . . . . . . . +300°C
Power Dissipation (Any Package) to +75°C . . . . . . . 450 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . 10 mW/°C
DVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V
DVDD to AVDD . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
DVSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6 V
AVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V
AVSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
Digital Input Voltage to DGND . . . . –0.3 V to DVDD +0.3 V
Analog Input
NOT ES
1Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. T his is a stress rating only and functional
operation of the device at these or any other conditions above those listed in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2T ransient currents of up to 100 mA will not cause SCR latch-up.
Voltage to AGND . . . . . . . . AVSS – 0.3 V to AVDD + 0.3 V
Input Current to Any Pin Except Supplies2 . . . . . . . . ±10 mA
Operating T emperature Range
Commercial Plastic (A, B Versions) . . . . . –40°C to +85°C
CAUTIO N
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although this device features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. T herefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. D
–3–