HiRel FPGAs
Actel Extended Flow1
Require-
ment
Step Screen
Method
1.
Wafer Lot Acceptance2
Destructive In-Line Bond Pull3
Internal Visual
5007 with Step Coverage Waiver
2011, Condition D
All Lots
Sample
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
All Lots
2.
3.
2010, Condition A
4.
Serialization
5.
Temperature Cycling
Constant Acceleration
Particle Impact Noise Detection
Radiographic
1010, Condition C
6.
2001, Condition D or E, Y1 Orientation Only
2020, Condition A
7.
8.
2012 (one view only)
9.
Pre-Burn-In Test
In accordance with applicable Actel device specification
1015, Condition D, 240 hours @ 125°C minimum
10.
11.
12.
13.
Burn-in Test
Interim (Post-Burn-In) Electrical Parameters In accordance with applicable Actel device specification
Reverse Bias Burn-In 1015, Condition C, 72 hours @ 150°C minimum
Interim (Post-Burn-In) Electrical Parameters In accordance with applicable Actel device specification
Percent Defective Allowable (PDA)
Calculation
5%, 3% Functional Parameters @ 25°C
14.
15.
Final Electrical Test
In accordance with Actel applicable device specification
which includes a, b, and c:
100%
100%
a. Static Tests
(1) 25°C
5005
5005
(Subgroup 1, Table1)
(2) –55°C and +125°C
(Subgroups 2, 3, Table 1)
b. Functional Tests
100%
(1) 25°C
5005
5005
(Subgroup 7, Table 15)
(2) –55°C and +125°C
(Subgroups 8A and B, Table 1)
c. Switching Tests at 25°C
(Subgroup 9, Table 1)
100%
100%
5005
1014
16.
Seal
a. Fine
b. Gross
17.
External Visual
2009
100%
Notes:
1. Actel offers the extended flow for customers who require additional screening beyond the requirements of the MIL-STD-833, Class B. Actel is
compliant to the requirements of MIL-STD-883, Paragraph 1.2.1, and MIL-I-38535, Appendix A. Actel is offering this extended flow
incorporating the majority of the screening procedures as outlined in Method 5004 of MIL-STD-883, Class S. The exceptions to Method 5004
are shown in notes 2 and 3 below.
2. Wafer lot acceptance is performed to Method 5007; however, the step coverage requirement as specified in Method 2018 must be waived.
3. MIL-STD-883, Method 5004 requires 100 percent Radiation latch-up testing (Method 1020). Actel will not be performing any radiation testing,
and this requirement must be waived in its entirety.
9
ACTEL [ Actel Corporation ]
