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A32100DX-CQ84B 参数 Datasheet PDF下载

A32100DX-CQ84B图片预览
型号: A32100DX-CQ84B
PDF下载: 下载PDF文件 查看货源
内容描述: HiRel它的FPGA [HiRel FPGAs]
分类和应用: 现场可编程门阵列可编程逻辑时钟
文件页数/大小: 98 页 / 2009 K
品牌: ACTEL [ Actel Corporation ]
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Actel MIL-STD-883 Product Flow  
883—Class B  
Requirement  
Step  
Screen  
883 Method  
1.  
2.  
3.  
Internal Visual  
2010, Test Condition B  
1010, Test Condition C  
100%  
100%  
100%  
Temperature Cycling  
Constant Acceleration  
2001, Test Condition D or E,  
Y1, Orientation Only  
4.  
Seal  
1014  
a. Fine  
b. Gross  
100%  
100%  
5.  
6.  
Visual Inspection  
2009  
100%  
100%  
Pre-Burn-In  
Electrical Parameters  
In accordance with applicable Actel  
device specification  
7.  
Burn-in Test  
1015, Condition D,  
160 hours @ 125°C or 80 hours @ 150°C  
100%  
100%  
8.  
Interim (Post-Burn-In)  
Electrical Parameters  
In accordance with applicable Actel  
device specification  
9.  
Percent Defective Allowable  
Final Electrical Test  
5%  
All Lots  
10.  
In accordance with applicable Actel  
device specification, which includes a, b, and c:  
a. Static Tests  
100%  
100%  
(1) 25°C  
(Subgroup 1, Table I)  
(2) –55°C and +125°C  
(Subgroups 2, 3, Table I)  
5005  
5005  
b. Functional Tests  
(1) 25°C  
(Subgroup 7, Table I)  
(2) –55°C and +125°C  
(Subgroups 8A and 8B, Table I)  
5005  
5005  
c. Switching Tests at 25°C  
(Subgroup 9, Table I)  
100%  
100%  
5005  
2009  
11.  
External Visual  
Note: When Destructive Physical Analysis (DPA) is performed on Class B devices, the step coverage requirement as specified in Method 2018  
must be waived.  
8
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