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S-8264B 参数 Datasheet PDF下载

S-8264B图片预览
型号: S-8264B
PDF下载: 下载PDF文件 查看货源
内容描述: [BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION)]
分类和应用:
文件页数/大小: 37 页 / 610 K
品牌: ABLIC [ ABLIC ]
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BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION)  
S-8264A/B/C Series  
Rev.4.4_00  
Test Circuits  
(1) Test Condition 1, Test Circuit 1  
Set V1, V2, V3, and V4 to 3.5 V. Overcharge detection voltage 1 (VCU1) is the V1 voltage when CO is “H” after the  
voltage of V1 has been gradually increased. The overcharge hysteresis voltage (VHC1) is the difference between V1  
and VCU1 when CO is “L” after the voltage of V1 has been gradually decreased.  
Overcharge detection voltage VCUn (n = 2 to 4) and overcharge hysteresis VHCn (n = 2 to 4) can be determined in the  
same way as when n = 1.  
(2) Test Condition 2, Test Circuit 1  
Set V1, V2, V3, and V4 to 3.5 V and in a moment of time (within 10 μs) increase V1 up to 5.0 V. The overcharge  
detection delay time (tCU) is the period from when V1 reached 5.0 V to when CO becomes “H”. After that, in a moment  
of time (within 10 μs) decrease V1 down to 3.5 V. The overcharge release delay time (tCL) is the period from when V1  
has reached 3.5 V to when CO becomes “L”.  
(3) Test Condition 3, Test Circuit 1  
Set V1, V2, V3, and V4 to 3.5 V and in a moment of time (within 10 μs) increase V1 up to 5.0 V. This is defined as the  
first rise. Within tCU 20 ms after the first rise, in a moment of time (within 10 μs) decrease V1 down to 3.5 V and then  
in a moment of time (within 10 μs) restore up to 5.0 V. This is defined as the second rise. When the period from when  
V1 was fallen to the second rise is short, CO becomes “H” after tCU has elapsed since the first rise. If the period from  
when V1 falls to the second rise is gradually made longer, CO becomes “H” when tCU has elapsed since the second rise.  
The overcharge timer reset delay time (tTR) is the period from V1 fall till the second rise at that time.  
(4) Test Condition 4, Test Circuit 2  
In the S-8264A/C Series, set V1, V2, V3, and V4 to 3.5 V and V5 to 14 V. The CTL pin response time (tCTL) is the period  
from when V5 reaches 0 V after V5 is in a moment of time (within 10 μs) decreased down to 0 V to when CO becomes  
“H”.  
In the S-8264B Series, set V1, V2, V3, and V4 to 3.5 V and V5 to 14 V after an overvoltage is detected and CO becomes  
“H”. In a moment of time (within 10 μs) raise V5 from 0 V to 14 V. The CTL pin response time (tCTL) is the period from  
when V5 becomes 14 V to when CO becomes “L”.  
(5) Test Condition 5, Test Circuit 3  
After setting V1, V2, V3, and V4 to 3.5 V and V5 to 0 V, in a moment of time (within 10 μs) increase V5 up to 8.5 V and  
decrease V5 again down to 0 V. When the period from when V5 was raised to when it has fallen is short, if an  
overcharge detection operation is performed subsequently, the overcharge detection time is tCU. However, when the  
period from when V5 is raised to when it is fallen is gradually made longer, the overcharge detection time during the  
subsequent overcharge detection operation is shorter than tCU. The transition time to test mode (tTST) is the period from  
when V5 was raised to when it has fallen at that time.  
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