Absolute Maximum Ratings
Description
Ratings
Ambient Storage or Operating Temperature to
Guarantee Nonvolatility of Stored Data
-40°C to +85°C
Voltage on Any Pin with Respect to Ground
D.C. Output Current
-1.0 to +7.0V
5mA
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage
to the device. This is a stress rating only, and the functional operation of the device at these or
any other conditions above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Lead Temperature (Soldering, 10 Seconds)
300°C
DC Operating Conditions
T = -40°C to +85°C, V = 5.0V ± 10%, Unless Otherwise Specified
A
CC
Symbol
Parameter
Min
Typ(1)
5.0
Max
5.5
Units
V
Test Conditions
V
Power Supply Voltage
4.5
CC
I
V
Supply Current
Supply Current
CC
60
100
µA
SCL @ 100KHz, Read or Write
SCL CMOS Levels, All Other Inputs = V or V - 0.3V
CC
CC
SS
CC
I
V
180
300
25
µA
µA
SCL @ 400KHz, Read or Write
SCL CMOS Levels, All Other Inputs = V or V - 0.3V
CC
SS
CC
(2)
I
Standby Current 0 to 70°C
8
SCL = SDA = V , All Other Inputs = V or V
CC
SB
CC
SS
(2)
I
Standby Current -40 to 85°C
Input Leakage Current
Output Leakage Current
Input Low Voltage
16
60
10
10
µA
µA
µA
V
SCL = SDA = V , All Other Inputs = V or V
CC SS CC
SB
I
V = V to V
IN SS CC
LI
I
V
= V to V
LO
OUT SS CC
V
-1.0
V
x 0.3
CC
IL
V
Input High Voltage
V
x 0.7
V
CC
+ 0.5
0.4
V
IH
CC
V
Output Low Voltage
Output Low Voltage
Input Hysteresis
V
I = 3mA
OL
OL1
V
0.6
V
I
= 6mA
OL2
OL
(3)
V
V
x .05
V
HYS
CC
(1) Typical values are measured at 25°C, 5.0V
(2) Must perform a stop command prior to measurement
(3) This parameter is periodically sampled and not 100% tested.
(4)
Power-Up Timing
Symbol
Parameter
Max
Units
µs
Endurance and Data Retention
(4)
t PUR
Power Up to Read Operation
Power Up to Write Operation
1
1
Parameter
Endurance
Min
10 Billion
10
Max
Units
(4)
t PUW
µs
R/W Cycles
Years
(4) tPUR and tPUW are the delays required from the time V is stable until the specified oper-
CC
Data Retention
ation can be initiated. These parameters are periodically sampled and not 100% tested.
AC Conditions of Test
AC Conditions
5.5V
Equivalent AC
Load Circuit
Test
1800 Ω
Input Pulse Levels
V
x 0.1 to V x 0.9
CC
CC
Output
100pF
Input Rise and Fall Times
Input and Output Timing Levels
10ns
V
CC
x 0.5
Capacitance
T = 25°C, f = 1.0MHz, V = 5V
A
CC
Symbol
Test
Max
Units
pF
Conditions
(3)
CI/O
Input/Output Capacitance (SDA)
Input Capacitance (SCL, WP)
8
6
V
I/O = 0V
(3)
CIN
pF
VIN = 0V
(3) This parameter is periodically sampled and not 100% tested.
2
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