PACE1754
DC ELECTRICAL SPECIFICATIONS (Over recommended operating conditions)
1
Symbol
Parameter
Input HIGH Voltage
Min
2.0
Max
V + 0.5
CC
Unit
V
Conditions
V
V
V
IH
IL
Input LOW Voltage
–0.5
0.8
V
Input Clamp Diode Voltage
–1.2
V
V
V
V
V
V
V
V
= 4.5V, I = –18mA
IN
CD
CC
2.4
V
= 4.5V,
= 0.8V, 2.0V
I
I
I
I
I
I
= –8.0mA
= –300µA
= 8.0mA
= 300µA
= 20.0mA
= 300µA
CC
OH
OH
OL
OL
OL
OL
V
OH
V
OL
V
OL
Output HIGH Voltage
Output LOW Voltage,
V
– 0.2
V
CC
IN
0.5
0.2
0.5
0.2
V
= 4.5V,
CC
except A – A
V
= 0.8V, 2.0V
0
15
IN
Output LOW Voltage,
A – A
V
= 4.5V,
CC
V
= 0.8V, 2.0V
0
15
IN
Input HIGH Current,
except IB – IB , parity/IB ,
I
IH
10
µA
V
V
= V
,
CC
0
15
16
IN
SING ERR, A /EXT AD ,
= 5.5V
0
0
CC
A /EXT AD , STRBA
1
1
Input HIGH Current,
IB – IB , parity/IB ,
V
V
= V
,
CC
IN
I
I
I
50
µA
µA
µA
= 5.5V
IH
0
15
16
CC
A /EXT AD , A /EXT AD
1
0
0
1
Input HIGH Current,
STRBA, SING ERR
V
V
= V
= 5.5V
,
CC
IN
500
–10
IH
IL
CC
Input LOW Current,
except IB – IB , parity/IB ,
V
V
= GND,
= 5.5V
0
15
16
IN
SING ERR, A /EXT AD ,
0
0
CC
A /EXT AD , STRBD, TEST ON
1
1
Input LOW Current,
IB – IB , parity/IB , SING ERR,
V
V
= GND,
= 5.5V
CC
IN
I
I
–50
µA
µA
IL
0
15
16
A /EXT AD , A /EXT AD
1
0
0
1
Input LOW Current,
STRBD, TEST ON
V
V
= GND,
= 5.5V
IN
–500
IL
CC
I
I
Output Three-State Current
Output Three-State Current
50
µA
µA
V
V
V
= 2.4V, V = 5.5V
CC
OZH
OUT
OUT
–50
= 0.5V, V = 5.5V
CC
OZL
Quiescent Power
Supply Current
(CMOS Input Levels)
< 0.2V or > V – 0.2V
CC
IN
I
10
50
mA
mA
f = 0MHz, Outputs Open,
CCQC
CCQT
V
CC
= 5.5V
Quiescent Power
Supply Current
V
IN
= 3.4V, f = 0MHz,
I
All Inputs, Outputs Open,
(TTL Input Levels)
V
CC
= 5.5V
Dynamic Power
Supply Current
f = 20MHz
40
50
60
mA
mA
mA
mA
pF
V
= 0V to V
,
IN
CC
I
I
f = 30MHz
tr = tf = 2.5 ns typ.,
Outputs Open, V = 5.5V
CCD
f = 40MHz
CC
2
Output Short Circuit Current
Input Capacitance
–25
V
= GND, V = 5.5V
OS
OUT CC
C
C
10
15
Inputs Only
IN
Output/Bi-directional
Capacitance
pF
Outputs Only
(Including I/O Buffers)
OUT
Notes:
1. 4.5V ≤ V ≤ 5.5V, –55°C ≤ T ≤ +125°C. Unless otherwise specified, testing shall be conducted at worst-case conditions.
CC
C
2. Duration of the short should not exceed one second; only one output may be shorted at a time.
Do c um e nt # MICRO-5 REV C
Pa g e 3 o f 20
PYRAMID [ PYRAMID SEMICONDUCTOR CORPORATION ]
