FEDL87V2107-01
OKI Semiconductor
ML87V2107
No.
96
97
98
99
100
Symbol
TESTM
SELF
V
SS
N.C.
VDD
I/O
I
I
—
—
—
Pad Remarks
pull-down 50k
pull-down 50k
Termination of
unused pin
Not used or
Memory test input pin (1: test mode)
connected to GND
Self refresh setting pin (0: Self refresh stopped, Connected to VDD
1: Self refresh operated)
*1
(3.3V)
X
Ground
Not used
Unused pin
X
3.3 V power supply
Pin Description
*1: Fix the SELF pin to a High level to operate self refresh while the device is operating.
Crystal specifications *
Parameter
Nominal oscillation frequency
Load capacitance
Series resistor
Frequency deviation
Frequency temperature
characteristics
Specification
24.545454/27.000000/28.636360/29.500000 MHz (Fundamental frequency)
8 pF
100Ω or less
Within
±50ppm
Within
±50ppm
*: KYOCERA CORP. crystal CX-53F Series
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