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ADS1245IDGST 参数 Datasheet PDF下载

ADS1245IDGST图片预览
型号: ADS1245IDGST
PDF下载: 下载PDF文件 查看货源
内容描述: 低功耗,24位模拟数字转换器 [Low-Power, 24-Bit Analog-to-Digital Converter]
分类和应用: 转换器
文件页数/大小: 19 页 / 252 K
品牌: BB [ BURR-BROWN CORPORATION ]
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www.ti.com  
SBAS287A − JUNE 2003 − REVISED SEPTEMBER 2003  
ORDERING INFORMATION  
SPECIFIED  
TEMPERATURE  
RANGE  
PACKAGE  
DESIGNATOR  
PACKAGE  
MARKING  
ORDERING  
NUMBER  
TRANSPORT  
MEDIA, QUANTITY  
PRODUCT  
PACKAGE−LEAD  
(1)  
ADS1245IDGST  
ADS1245IDGSR  
Tape and Reel, 250  
Tape and Reel, 2500  
ADS1245  
MSOP-10  
DGS  
−40°C to +85°C  
BHI  
(1)  
For the most current specifications and package information, refer to our web site at www.ti.com.  
PIN ASSIGNMENTS  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range unless otherwise noted  
(1)  
ADS1245  
−0.3 to +6  
UNIT  
DGS PACKAGE  
MSOP  
(TOP VIEW)  
AVDD to GND  
V
V
DVDD to GND  
−0.3 to +3.6  
Input Current  
100, momentary  
10, continuous  
−0.5 to AVDD + 0.5  
−0.3 to DVDD + 0.3  
−0.3 to DVDD + 0.3  
+150  
mA  
mA  
V
ADS1245  
Input Current  
CLK  
GND  
VREFP  
VREFN  
AINN  
1
2
3
4
5
10  
9
Analog Input Voltage to GND  
Analog Input Voltage to GND  
Digital Output Voltage to GND  
Maximum Junction Temperature  
Operating Temperature Range  
Storage Temperature Range  
Lead Temperature (soldering, 10s)  
SCLK  
V
V
8
DRDY/DOUT  
DVDD  
°C  
°C  
°C  
°C  
7
−40 to +85  
AINP  
6
AVDD  
−60 to +150  
+300  
(1)  
Stresses above these ratings may cause permanent damage.  
Exposure to absolute maximum conditions for extended periods  
may degrade device reliability. These are stress ratings only, and  
functional operation of the device at these or any other conditions  
beyond those specified is not implied.  
Terminal Functions  
TERMINAL  
This integrated circuit can be damaged by ESD. Texas  
Instruments recommends that all integrated circuits be  
handledwith appropriate precautions. Failure to observe  
NAME  
NO.  
DESCRIPTION  
GND  
1
2
3
4
5
6
7
8
Analog and digital ground  
Positive reference input  
Negative reference input  
Negative analog input  
Positive analog input  
proper handling and installation procedures can cause damage.  
VREFP  
VREFN  
AINN  
ESD damage can range from subtle performance degradation to  
complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could  
cause the device not to meet its published specifications.  
AINP  
AVDD  
Analog power supply, 2.5V to 5.25V  
Digital power supply, 1.8V to 3.6V  
DVDD  
DRDY/DOUT  
Dual-purpose output:  
Data ready: indicates valid data by going low.  
Data output: outputs data, MSB first, on the  
first rising edge of SCLK.  
SCLK  
CLK  
9
Serial clock input: clocks out data on the  
rising edge. Used to initiate calibration and  
Sleep mode (see text for more details).  
10 System clock input: typically 2.4576MHz  
2