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AS4C256M8D2-25BCN 参数 Datasheet PDF下载

AS4C256M8D2-25BCN图片预览
型号: AS4C256M8D2-25BCN
PDF下载: 下载PDF文件 查看货源
内容描述: [Weak Strength Data-Output Driver Option]
分类和应用: 时钟动态存储器双倍数据速率内存集成电路
文件页数/大小: 70 页 / 2762 K
品牌: ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
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2Gb DDR2 - AS4C256M8D2  
Signal Pin Description  
Pin  
CK, CK  
CKE  
Type  
Input  
Input  
Function  
The system clock input. All inputs except DQs and DMs are sampled on the rising edge of CK.  
Activates the CK signal when high and deactivates the CK signal when low, thereby initiates either the  
Power Down mode, or the Self Refresh mode.  
CS  
Input  
Input  
Input  
CS enables the command decoder when low and disables the command decoder when high. When  
the command decoder is disabled, new commands are ignored but previous operations continue.  
RAS, CAS, WE  
A0 - A14  
When sampled at the positive rising edge of the clock, CAS, RAS, and WE define the command to be  
executed by the SDRAM.  
During a Bank Activate command cycle, A0-A14 defines the row address (RA0-RA14) when sampled  
at the rising clock edge for x8.  
During a Read or Write command cycle, A0-An defines the column address (CA0-CAn) when sampled  
at the rising clock edge.CAn depends on the SDRAM organization:  
256M x 8 DDR CAn = CA9  
In addition to the column address, A10(=AP) is used to invoke autoprecharge operation at the end of  
the burst read or write cycle. If A10 is high, autoprecharge is selected and BA0, BA1, BA2 defines the  
bank to be precharged. If A10 is low, autoprecharge is disabled.  
During a Precharge command cycle, A10(=AP) is used in conjunction with BA0, BA1and BA2 to control  
which bank(s) to precharge. If A10 is high, all eight banks will be precharged simultaneously regardless  
of state of BA0 , BA1 and BA2.  
BA0-BA2  
DQx  
Input  
Selects which bank is to be active.  
Input/  
Data Input/Output pins operate in the same manner as on conventional DRAMs.  
DQ0-DQ7 for x8 device.  
Output  
DQS, (DQS)  
Input/  
Data Strobe, output with read data, input with write data. Edge-aligned with read data, centered in write  
data. For x8 device, an RDQS option using DM pin can be enabled via the EMRS(1) to simplify read  
timing. The data strobes DQS and RDQS may be used in single ended mode or paired with optional  
complimentary signals DQS and RDQS to provide differential pair signaling to the system during both  
reads and writes. An EMRS(1) control bit enables or disables all complementary data strobe signals.  
RDQS, (RDQS)  
Output  
DM  
Input  
DM is an input mask signal for write data. Input data is masked when DM is sampled high along with  
that input data during a Write access. DM is sampled on both edges of DQS.  
Although DM pins are input only, the DM loading is designed to match that of DQ and DQS pins.  
For x8 device, the function of DM or RDQS/RDQS is enabled by EMRS command.  
VDD, VSS  
VDDQ, VSSQ  
VREF  
Supply  
Supply  
Input  
Power and ground for the input buffers and the core logic.  
Isolated power supply and ground for the output buffers to provide improved noise immunity.  
SSTL Reference Voltage for Inputs  
VDDL, VSSDL  
ODT  
Supply  
Input  
Isolated power supply and ground for the DLL to provide improved noise immunity.  
On Die Termination Enable. It enables termination resistance internal to the DRAM. ODT is applied to  
each DQ, DQS, DQS, RDQS, RDQS and DM for x8 device. ODT will be ignored if EMRS disable the  
function.  
Confidential  
-4/70-  
Rev.1.0 Sep. 2015