Pre-Production
WM8786
Test Conditions
DVDD = 3.3V, AVDD = 5.0V, TA = +25oC, 1kHz signal, A-weighted, fs = 48kHz, MCLK = 256fs, 24-bit audio data, Slave Mode
unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply Current
Analogue supply current
Digital supply current
Power Down
27
mA
5
mA
22
uA
Note:
1. VMID is decoupled with 10uF and 0.1uF capacitors close to the device package. Smaller capacitors may reduce
performance.
TERMINOLOGY
1. Signal-to-noise ratio (dB) – Ratio of output level with 1kHz full scale input, to the output level with all zeros into the
digital input, over a 20Hz to 20kHz bandwidth. (No Auto-zero or Automute function is employed in achieving these
results).
2. Dynamic range (dB) - DR is a measure of the difference between the highest and lowest portions of a signal.
Normally a THD+N measurement at 60dB below full scale. The measured signal is then corrected by adding the 60dB
to it. (e.g. THD+N @ -60dB= -32dB, DR= 92dB).
3. THD+N (dB) - THD+N is a ratio, of the rms values, of (Noise + Distortion)/Signal.
4. Channel Separation (dB) - Also known as Cross-Talk. This is a measure of the amount one channel is isolated from
the other. Normally measured by sending a full scale signal down one channel and measuring the other.
5. All performance measurements are done with a 20kHz low pass filter, and where noted an A-weight filter, except
where noted. Failure to use such a filter will result in higher THD+N and lower SNR and Dynamic Range readings
than are found in the Electrical Characteristics. The low pass filter removes out of band noise; although this is not
audible, it may affect dynamic specification values.
PP Rev 3.0 December 2005
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WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
