WM8782
Production Data
ELECTRICAL CHARACTERISTICS
Test Conditions
DVDD = 3.3V, AVDD = 5.0V, TA = +25oC, 1kHz signal, A-weighted, fs = 48kHz, MCLK = 256fs, 24-bit audio data, Slave Mode
unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Vrms
kΩ
ADC Performance
Full Scale Input Signal Level
(for ADC 0dB Input)
1.0
Input resistance, using
recommended external resistor
network on p17.
10
Input capacitance
20
pF
dB
Signal to Noise Ratio
(see Terminology note 1,2,4)
SNR
SNR
THD
A-weighted,
@ fs = 48kHz
Unweighted,
@ fs = 48kHz
A-weighted,
93
93
102
100
100
dB
dB
@ fs = 48kHz, AVDD =
3.3V
Signal to Noise Ratio
(see Terminology note 1,2,4)
A-weighted,
@ fs = 96kHz
Unweighted,
@ fs = 96kHz
A-weighted,
99
99
99
dB
dB
dB
@ fs = 96kHz, AVDD =
3.3V
Total Harmonic Distortion
1kHz, -1dB Full Scale
@ fs = 48kHz
-91
-91
-90
dB
dB
dB
1kHz, -1dB Full Scale
@ fs = 96kHz
1kHz, -1dB Full Scale
@ fs = 192kHz
Dynamic Range
DNR
-60dBFS
93
102
90
dB
dB
Channel Separation
1kHz Input
(see Terminology note 4)
Channel Level Matching
Channel Phase Deviation
Power Supply Rejection Ratio
1kHz signal
1kHz signal
0.1
0.0001
50
dB
Degree
dB
PSRR
1kHz 100mVpp, applied
to AVDD, DVDD
Digital Logic Levels (TTL Levels)
Input LOW level
VIL
VIH
0.8
+1
V
Input HIGH level
2.0
-1
V
Input leakage current – digital pad
0.2
85
µA
µA
Input leakage current – digital
tristate input (Note 3)
Input capacitance
5
pF
V
Output LOW
VOL
VOH
I
OL=1mA
0.1 x DVDD
+4%
Output HIGH
I
OH= -1mA
0.9 x DVDD
–4%
V
Analogue Reference Levels
Midrail Reference Voltage
VMID
AVDD to VMID and
VMID to VREFN
AVDD/2
V
Potential Divider Resistance
Buffered Reference Voltage
VREF source current
RVMID
VREFP
IVREF
50
kΩ
V
–4%
AVDD/2
+4%
5
5
mA
mA
VREF sink current
IVREF
PD, August 2006, Rev 4.2
6
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
