Production Data
WM8770
ELECTRICAL CHARACTERISTICS
Test Conditions
AVDD = 5V, DVDD = 3.3V, AGND = 0V, DGND = 0V, TA = +25oC, fs = 48kHz, MCLK = 256fs, ADC/DAC in Slave Mode unless
otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Digital Logic Levels (TTL Levels)
Input LOW level
VIL
VIH
0.8
V
V
V
V
Input HIGH level
2.0
Output LOW
VOL
VOH
I
OL=1mA
0.1 x DVDD
Output HIGH
I
OH-1mA
0.9 x DVDD
Analogue Reference Levels
Reference voltage
VVMID
RVMID
AVDD/2
50k
V
Potential divider resistance
AVDD to VMID and
VMID to AGND
Ω
DAC Performance (Load = 10kΩ, 50pF)
0dBFs Full scale output voltage
1.0 x
AVDD/5
106
Vrms
dB
SNR (Note 1,2)
SNR (Note 1,2)
A-weighted,
@ fs = 48kHz
A-weighted
100
100
106
106
dB
@ fs = 96kHz
Dynamic Range (Note 2)
DNR
A-weighted, -60dB
full scale input
dB
Total Harmonic Distortion (THD)
DAC channel separation
1kHz, 0dBFs
1kHz Input
-94
110
1
-88
dB
dB
dB
DAC analogue Volume Gain
Step Size
DAC analogue Volume Gain
Range
0 to -100
-116
dB
dB
dB
Output Noise
A-weighted output
muted
DAC analogue Volume Mute
Attenuation
1kHz Input, 0dB gain
100
Power Supply Rejection Ratio
PSRR
1kHz 100mVpp
50
45
dB
dB
20Hz to 20kHz
100mVpp
ADC Performance
Input Signal Level (0dB)
1.0 x
AVDD/5
102
Vrms
dB
SNR (Note 1,2)
SNR (Note 1,2)
A-weighted, 0dB gain
@ fs = 48kHz
A-weighted, 0dB gain
@ fs = 96kHz
96
dB
Dynamic Range (note 2)
A-weighted, -60dB
full scale input
102
dB
Total Harmonic Distortion (THD)
kHz, 0dBFs
1kHz, -1dBFs
1kHz Input
-89
-94
dB
dB
dB
dB
dB
dB
dB
dB
-90
ADC Channel Separation
Programmable Gain Step Size
Programmable Gain Range
Mute Attenuation
85
1.0
1kHz Input
1kHz Input, 0dB gain
1kHz 100mVpp
-12 to +19
82
Power Supply Rejection Ratio
PSRR
50
20Hz to 20kHz
100mVpp
45
PD Rev 4.1 June 2005
7
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
