WM8216
Production Data
Test Conditions
AVDD = DVDD1 = DVDD2 = 3.3V, AGND = DGND = 0V, TA = 25°C, MCLK = 60MHz for 2-channel mode and 45MHz for 1-
channel mode unless otherwise stated.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
16.6
22.2
7.5
TYP
MAX
UNITS
MCLK period – 2 channel mode
1 channel mode
tPER
ns
MCLK high period – 2 channel mode
1 channel mode
tMCLKH
tMCLKL
8.3
11.1
8.3
ns
ns
MCLK low period – 2 channel mode
1 channel mode
7.5
11.1
RSMP pulse high time
tRSD
tVSD
5
5
0
3
5
1
1
ns
ns
ns
ns
ns
ns
ns
VSMP pulse high time
RSMP falling to VSMP rising time
MCLK rising to VSMP rising time
MCLK falling to VSMP falling time
VSMP falling to MCLK rising time 2
1st MCLK falling edge after VSMP
falling to RSMP rising time
tRSFVSR
tMRVSR
tMFVSF
tVSFMR
tMF1RS
2-channel mode pixel rate
1-channel mode pixel rate
Output propagation delay
Output latency. From 1st rising edge
of MCLK after VSMP falling to data
output
tPR2
tPR1
tPD
33.2
16.6
ns
ns
ns
5
7
10
LAT
MCLK
periods
Notes:
1.
2.
Parameters are measured at 50% of the rising/falling edge.
In 1-Channel mode, if the VSMP falling edge is placed more than 3ns before the rising edge of MCLK the output
amplitude of the WM8216 will decrease.
PD Rev 4.0 March 2007
9
w
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
