Production Data
WM2633
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to
damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of
this device.
CONDITION
MIN
MAX
7V
Digital supply voltages, AVDD or DVDD to GND
Supply voltage differences, AVDD to DVDD
Reference input voltage
-2.8V
-0.3V
-0.3V
2.8V
AVDD + 0.3V
DVDD + 0.3V
Digital input voltage range to GND
Operating temperature range, TA
WM2633CDT
WM2633IDT
0°C
70°C
85°C
-40°C
-65°C
Storage temperature
150°C
Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds
260°C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply voltage
AVDD,
DVDD
VIH
2.7
2
5.5
V
High-level digital input voltage
Low-level digital input voltage
Reference voltage to REF
Load resistance
See Note 1
See Note 1
See Note 1
V
V
VIL
0.8
VREF
RL
AVDD - 1.5
V
2
kΩ
pF
°C
°C
Load capacitance
CL
100
70
Operating free-air temperature
TA
WM2633CDT
0
WM2633IDT
-40
85
Note: Reference input voltages greater than AVDD/2 will cause saturation for large DAC codes.
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 July 1999
3