Production Data
WM2613
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or
beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to
damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this
device.
CONDITION
MIN
MAX
7V
Supply voltages, AVDD or DVDD to GND
Supply voltage differences, AVDD to DVDD
Reference input voltage
-2.8V
-0.3V
-0.3V
2.8V
DVDD + 0.3V
AVDD + 0.3V
Digital input voltage range to GND
Operating temperature range, TA
WM2613C
WM2613I
0°C
70°C
85°C
-40°C
-65°C
Storage temperature
150°C
Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds
260°C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply voltage
AVDD, DVDD
2.7
2
5.5
V
V
V
V
High-level digital input voltage
Low-level digital input voltage
Reference voltage to REFIN
VIH
VIL
DVDD = 2.7V to 5.5V
DVDD = 2.7V to 5.5V
See Note
0.8
VREF
AVDD - 1.5
Load resistance
RL
CL
TA
2
kW
pF
°C
°C
Load capacitance
100
70
Operating free-air temperature
WM2613CDT
WM2613IDT
0
-40
85
Note: Reference voltages greater than AVDD/2 will cause saturation for large DAC codes.
WOLFSON MICROELECTRONICS LTD
Production Data Rev 1.0 June 1999
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
