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W3EG7236S265D3 参数 Datasheet PDF下载

W3EG7236S265D3图片预览
型号: W3EG7236S265D3
PDF下载: 下载PDF文件 查看货源
内容描述: 256MB - 32Mx72 DDR SDRAM注册瓦特/ PLL [256MB - 32Mx72 DDR SDRAM REGISTERED, w/PLL]
分类和应用: 存储内存集成电路动态存储器双倍数据速率
文件页数/大小: 12 页 / 173 K
品牌: WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
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W3EG7236S-D3  
White Electronic Designs  
PRELIMINARY  
Notes  
1.  
2.  
All voltages referenced to VSS  
11. It is recommended that DQS be valid (HIGH or LOW) on or before  
the WRITE command. The case shown (DQS going from High-Z to  
logic LOW) applies when no WRITEs were previously in progress  
on the bus. If a previous WRITE was in progress, DQS could be  
Tests for AC timing, IDD, and electrical AC and DC characteristics  
may be conducted at normal reference / supply voltage levels, but  
the related specifications and device operations are guaranteed for  
the full voltage range specified.  
high during this time, depending on tDQSS  
.
12. The refresh period is 64ms. This equates to an average refresh  
rate of 15.625µs. However, an AUTO REFRESH command must  
be asserted at least once every 140.6µs; burst refreshing or  
posting by the DRAM controller greater than eight refresh cycles is  
not allowed.  
3.  
Outputs are measured with equivalent load:  
VTT  
50Ω  
13. The valid data window is derived by achieving other specifications  
- tHP (tCK/2), tDQSQ, and tQH (tQH = tHP - tQHS). The data valid  
window derates directly proportional with the clock duty cycle  
and a practical data valid window can be derived. The clock is  
allowed a maximum duty cycled variation of 45/55. Functionality  
is uncertain when operating beyond a 45/55 ratio. The data valid  
window derating curves are provided below for duty cycles ranging  
between 50/50 and 45/55.  
RReeffeerreennccee  
Outputt  
Point  
30ppFF  
(VOUT  
)
4.  
AC timing and IDD tests may use a VIL-to-VIH swing of up to 1.5V  
in the test environment, but input timing is still referenced to VREF  
(or to the crossing point for CK/CK#), and parameter specifications  
are guaranteed for the specified AC input levels under normal use  
conditions. The minimum slew rate for the input signals used to  
test the device is 1V/ns in the range between VIL(AC) and VIH(AC).  
14. Referenced to each output group: x4 = DQS with DQ0-DQ4.  
15. READs and WRITEs with auto precharge are not allowed to be  
issued until tRAS (MIN) can be satisfied prior to the internal precharge  
command being issued.  
5.  
6.  
The AC and DC input level specifications are defined in the SSTL_  
2 standard (i.e., the receiver will effectively switch as a result of the  
signal crossing the AC input level, and will remain in that state as  
long as the signal does not ring back above [below] the DC input  
LOW [high] level).  
16. JEDEC specifies CK and CK# input slew rate must be > 1V/ns  
(2V/ns differentially).  
17. DQ and DM input slew rates must not deviate from DQS by more  
than 10%. If the DQ/DM/DQS slew rate is less than 0.5V/ns, timing  
must be derated: 50ps must be added to tDS and tDH for each  
100mV/ns reduction in slew rate. If slew rates exceeds 4V/ns,  
functionality is uncertain.  
Command/Address input slew rate = 0.5V/ns. For -75 with slew  
rates 1V/ns and faster, tIS and tIH are reduced to 900ps. If the  
slew rate is less than 0.5V/ns, timing must be derated: tIS has an  
additional 50ps per each 100mV/ns reduction in slew rate from the  
500mV/ns. tIH has 0ps added, that is, it remains constant. If the  
slew rate exceeds 4.5V/ns, functionality is uncertain.  
18.  
t
HP min is the lesser of tCL min and tCH min actually applied to the  
device CK and CK# inputs, collectively during bank active.  
19. This maximum value is derived from the referenced test load. In  
practice, the values obtained in a typical terminated design may  
reflect up to 310ps less for tHZ (MAX) and last DVW. tHZ (MAX) will  
prevail over the tDQSCK (MAX) + tRPST (MAX) condition. tLZ (MIN)  
will prevail over tDQSCK (MIN) + PRE (MAX) condition.  
7.  
8.  
Inputs are not recognized as valid until VREF stabilizes. Exception:  
during the period before VREF stabilizes, CKE 0.3 x VCCQ is  
recognized as LOW.  
tHZ and tLZ transitions occur in the same access time windows as  
20. For slew rates greater than 1V/ns the (LZ) transition will start about  
310ps earlier.  
valid data transitions. These parameters are not referenced to a  
specific voltage level, but specify when the device output is no  
longer driving (HZ) and begins driving (LZ).  
21. CKE must be active (High) during the entire time a refresh  
command is executed. That is, from the time the AUTO REFRESH  
command is registered, CKE must be active at each rising clock  
edge, until tREF later.  
9.  
The maximum limit for this parameter is not a device limit. The  
device will operate with a greater value for this parameter, but  
system performance (bus turnaround) will degrade accordingly.  
22. Whenever the operating frequency is altered, not including jitter,  
the DLL is required to be reset. This is followed by 200 clock cycles  
(before READ commands).  
10. This is not a device limit. The device will operate with a negative  
value, but system performance could be degraded due to bus  
turnaround.  
November 2004  
Rev. 1  
10  
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
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