VSC6134
Datasheet
Table 468. Scan Test Pins (continued)
Pin
Name
I/O Type
Description
L30
SCANOUT34
TO
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
L31
L29
K32
K34
K33
K30
K31
K29
J32
J34
J33
H34
H33
G33
G34
SCANOUT35
SCANOUT36
SCANOUT37
SCANOUT38
SCANOUT39
SCANOUT40
SCANOUT41
SCANOUT42
SCANOUT43
SCANOUT44
SCANOUT45
SCANOUT46
SCANOUT47
SCANOUT48
SCANOUT49
TO
TO
TO
TO
TO
TO
TO
TO
TO
TO
TO
TO
TO
TO
TO
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
Scan chain output. Must be left unconnected for
functional (non-scan) operation.
421 of 438
VMDS-10185 Revision 4.0
July 2006
VITESSE [ VITESSE SEMICONDUCTOR CORPORATION ]
