TE
tmCH
T2316162A
EDO-PAGE-MODE EARLY-WRITE CYCLE
t
t
R A SC
R
P
V
V
IH
IL
R
A
A S
S H
t
t
t
t
R
C
S H
PC
P
SH
t
t
t
t
t
t
t
t
t
t
C
C
R
P
R C
D
CAS,CLCH
C
CAS,CLCH
C
P
CAS,CLCH
P N
V
V
IH
IL
C A
S L,C
t
A
R
t
t
R
R
A D
A L
H
t
t
t
t
t
W
t
t
t
t
A
S R
R
A
H
A S C
C
A
H
A S C
C
A
H
A S C
C
A
V
V
IH
IL
A D
D
W
R
E
R O
W
C
O
LU
M
N
C
O
LU
M
N
C
O
LU
M
N
R O W
t
t
t
C
W
L
H
C
W
W
W
L
H
C
W
L
H
t
t
t
t
t
t
W
C
S
W
C
C
S
C
W
C
S
W C
t
t
W
P
P
W
P
V
V
IH
IL
t
t
W
C
R
R W
L
t
D
H R
t
t
t
t
t
t
D
D
S
D
H
D
S
D
H
D
S
H
V
V
IO
IO
H
L
I/O
V A LID
D
A
TA
V A LID
D
A
TA
V A LID D A TA
V
V
IH
IL
O
E
EDO-PAGE-MODE READ-WRITE CYCLE
(LATE WRITE and READ-MODIFY-WRITE CYCLES)
t
t
R
R A SC
P
V
V
IH
IL
R A S
t
t
t
t
R
C
O
A
S H
PC
M
SH
t
t
t
t
t
t
t
t
t
t
C
C
R
P
R C
D
C
A
A
S,
C
LC
H
C
P
C
A
A
S,
C
LC
H
C
P
C
A
S,
C
LC
H
P N
V
V
IH
IL
C A S L ,C A S H
t
t
t
A
R
R
R
t
R
A D
A L
t
t
t
t
t
t
ASC
t
A
S R
A
H
ASC
C
H
A S C
C
H
C
A
H
V
V
IH
IL
A D
D R
R O
W
C
LU
M
N
t
C
O
LU
M
N
C
O
LU
M
N
R O W
R W
t
D
W
t
R W
L
t
RC S
t
t
C
C
L
C
t
W
L
W L
t
t
W
P
W
D
D
P
W
P
t
t
t
A W
t
A W
D
A W
D
D
t
t
C
W
D
C
W
C
W
V
V
IH
IL
W
E
t
t
t
A
A
A
P
A
A
t
R
A C
t
t
D H
D
H
t
D
H
t
t
A C
A C
P
t
t
t
D
D
S
D
S
S
t
t
t
t
t
C
A C
LZ
C
C
A C
LZ
C
C
A C
LZ
t
C
V
V
IO
IO
H
L
VALID
VALID
VALID
VALID
VALID
VALID
I/O
O
P EN
O
P EN
D
D
D
D
D
D
OUT
I N
OUT
I N
OUT
I N
t
O
t
O
t
t
O
FF2
FF2
FF2
t
t
O
t
O
O
E H
O
A
C
A
C
A C
V
V
IH
IL
O
E
DON'T CARE
UNDEFINED
Note: 1. tPC can be measured from falling edge to falling edge of CAS , or from rising edge to rising edge of
CAS . Both measurements must meet the tPC specification.
TM Technology Inc. reserves the right
to change products or specifications without notice.
P. 9
Publication Date: APR. 2002
Revision:E
TMT [ TAIWAN MEMORY TECHNOLOGY ]
