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TPS7A8001DRBR 参数 Datasheet PDF下载

TPS7A8001DRBR图片预览
型号: TPS7A8001DRBR
PDF下载: 下载PDF文件 查看货源
内容描述: 低噪声,高带宽PSRR ,低压差1A线性稳压器 [Low-Noise, High-Bandwidth PSRR, Low-Dropout 1A Linear Regulator]
分类和应用: 线性稳压器IC调节器电源电路光电二极管输出元件信息通信管理PC
文件页数/大小: 20 页 / 1167 K
品牌: TI [ TEXAS INSTRUMENTS ]
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TPS7A80xx  
SBVS135A JUNE 2010REVISED JUNE 2010  
www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
ORDERING INFORMATION(1)  
(2)  
PRODUCT  
VOUT  
TPS7A80xxyyyz  
XX is nominal output voltage (for example, 28 = 2.8V, 285 = 2.85V, 01 = Adjustable).  
YYY is package designator.  
Z is package quantity.  
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the  
device product folder on www.ti.com.  
(2) Output voltages from 0.9V to 5.0V in 50mV increments are available through the use of innovative factory EEPROM programming;  
minimum order quantities may apply. Contact factory for details and availability.  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range (unless otherwise noted)(1)  
VALUE  
MIN  
–0.3  
–0.3  
MAX  
+7.0  
+3.6  
UNIT  
V
IN  
FB, NR  
V
Voltage  
VIN  
+
EN  
–0.3  
V
0.3(2)  
+7.0  
OUT  
–0.3  
V
A
Current  
OUT  
Internally Limited  
Operating virtual junction, TJ  
–55  
–55  
+150  
°C  
°C  
kV  
Temperature  
Storage, Tstg  
+150  
2
Human body model (HBM) QSS 009-105 (JESD22-A114A)  
Electrostatic Discharge Rating(3)  
Charged device model (CDM) QSS 009-147  
(JESD22-C101B.01)  
500  
V
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to  
absolute-maximum-rated conditions for extended periods my affect device reliability.  
(2) VEN absolute maximum rating is VIN + 0.3V or +7.0V, whichever is smaller.  
(3) ESD testing is performed according to the respective JESD22 JEDEC standard.  
2
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Copyright © 2010, Texas Instruments Incorporated  
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