TPS23750
TPS23770
www.ti.com
SLVS590A–JULY 2005–REVISED AUGUST 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
UVLO THRESHOLDS
PACKAGE(2)
TSSOP-20 PowerPAD™
TPS23750PWP
TA
MARKING
TYPE
Standard
Legacy
LOW
30.5 V
30.5 V
HIGH
39.3 V
35.1 V
TPS23750
TPS23770
–40°C to 85°C
TPS23770PWP
(1) Add an R suffix to the device type for tape and reel.
(2) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range and with respect to VSS unless otherwise noted(1)
UNIT
Input voltage range(2)
Input voltage range
Input voltage range(3)
Input voltage range
Input voltage range
RSN, COM, RTN, SEN
–0.7 V to 100 V
–0.3 V to 100 V
–0.3 V to 6.5 V
–0.3 V to 20 V
–0.3 V to 0.3 V
–0.3 V to 100 V
–0.3 V to 12 V
Internally limited
Internally limited
Internally limited
25 mArms
AUX, VDD, DET, SENP
[VBIAS, BL, TMR, FB, COMP, FREQ, RSP, MODE] to RTN
[GATE or AUX] to COM
[RSN to RTN] and [COM to RTN]
SENP to SEN
Input voltage range(3)
Sourcing current
CLASS
AUX
VBIAS
Sourcing current
Sourcing or sinking current, COMP
Average sourcing or sinking current, GATE
HBM ESD rating
2 kV
(4)
ESD – system level (contact/air) at RJ-45
Continuous total power dissipation
8 kV / 15 kV
See Dissipation Rating Table
Internally limited
–65°C to 150°C
260°C
TJ
Maximum operating junction temperature
Storage temperature range
Tstg
Lead temperature 1.6mm (1/16-inch) from case for 10 seconds
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) IRTN = 0 for VRTN > 80 V. Maximum IRTN = 500 mA at 80 V.
(3) Do not apply external voltage sources to CLASS, DET, GATE, FREQ, VBIAS, and TMR.
(4) Surges applied to RJ-45 of Figure 40 between pins of RJ-45, and between pins and output voltage rails per EN61000-4-2, 1999 with no
device failure.
2