TMP435
SBOS495A –MARCH 2010–REVISED APRIL 2010
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PARAMETRIC MEASUREMENT INFORMATION
TEST CIRCUITS
SERIES RESISTANCE CONFIGURATION
(a) GND Collector-Connected Transistor
(1)
RS
DXP
DXN
(1)
RS
(b) Diode-Connected Transistor
(1)
RS
DXP
DXN
(1)
RS
(1) RS should be less than 1kΩ; see Filtering section.
Figure 11.
DIFFERENTIAL CAPACITANCE CONFIGURATION
(a) GND Collector-Connected Transistor
DXP
(1)
CDIFF
DXN
(b) Diode-Connected Transistor
DXP
(1)
CDIFF
DXN
(1) CDIFF should be less than 2200pF; see Filtering section.
Figure 12.
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