SBAS424C – JUNE 2009 – REVISED MARCH 2010
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
For the most current package and ordering information see the Package Option Addendum at the end of this
document, or see the TI web site at
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
ADS1259
MIN
AVDD to AVSS
AVSS to DGND
DVDD to DGND
Input current, momentary
Input current, continuous
Analog input voltage to DGND
Digital input voltage to DGND
Maximum junction temperature
Operating temperature range
Storage temperature range
(1)
–40
–60
–0.3
–2.8
–0.3
–100
–10
AVSS – 0.3
–0.3
MAX
+5.5
+0.3
+5.5
+100
+10
AVDD + 0.3
DVDD + 0.3
+150
+125
+150
UNIT
V
V
V
mA
mA
V
V
°C
°C
°C
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
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