MSP430G2955
MSP430G2855
MSP430G2755
SLAS800 –MARCH 2013
www.ti.com
MAX UNIT
10-Bit ADC, External Reference(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP
VEREF+ > VEREF–,
SREF1 = 1, SREF0 = 0
1.4
VCC
Positive external reference input
voltage range
VEREF+
V
(2)
VEREF– ≤ VEREF+ ≤ VCC – 0.15 V,
SREF1 = 1, SREF0 = 1
1.4
0
3
(3)
Negative external reference input
VEREF–
VEREF+ > VEREF–
1.2
V
V
(4)
voltage range
Differential external reference
input voltage range,
(5)
ΔVEREF
VEREF+ > VEREF–
1.4
VCC
ΔVEREF = VEREF+ – VEREF–
0 V ≤ VEREF+ ≤ VCC
SREF1 = 1, SREF0 = 0
,
3 V
±1
IVEREF+
Static input current into VEREF+
Static input current into VEREF–
µA
µA
0 V ≤ VEREF+ ≤ VCC – 0.15 V ≤ 3 V,
3 V
3 V
0
SREF1 = 1, SREF0 = 1(3)
IVEREF–
0 V ≤ VEREF– ≤ VCC
±1
(1) The external reference is used during conversion to charge and discharge the capacitance array. The input capacitance, CI, is also the
dynamic load for an external reference during conversion. The dynamic impedance of the reference supply should follow the
recommendations on analog-source impedance to allow the charge to settle for 10-bit accuracy.
(2) The accuracy limits the minimum positive external reference voltage. Lower reference voltage levels may be applied with reduced
accuracy requirements.
(3) Under this condition the external reference is internally buffered. The reference buffer is active and requires the reference buffer supply
current IREFB. The current consumption can be limited to the sample and conversion period with REBURST = 1.
(4) The accuracy limits the maximum negative external reference voltage. Higher reference voltage levels may be applied with reduced
accuracy requirements.
(5) The accuracy limits the minimum external differential reference voltage. Lower differential reference voltage levels may be applied with
reduced accuracy requirements.
10-Bit ADC, Timing Parameters
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
0.45
0.45
TYP
MAX
6.3
UNIT
ADC10SR = 0
ADC10SR = 1
ADC10 input clock
frequency
For specified performance of
ADC10 linearity parameters
fADC10CLK
fADC10OSC
3 V
MHz
1.5
ADC10 built-in oscillator ADC10DIVx = 0, ADC10SSELx = 0,
3 V
3 V
3.7
6.3
MHz
µs
frequency
fADC10CLK = fADC10OSC
ADC10 built-in oscillator, ADC10SSELx = 0,
fADC10CLK = fADC10OSC
2.06
3.51
tCONVERT
Conversion time
13 ×
fADC10CLK from ACLK, MCLK, or SMCLK:
ADC10DIV ×
1/fADC10CLK
ADC10SSELx ≠ 0
Turn-on settling time of
the ADC
(1)
tADC10ON
100
ns
(1) The condition is that the error in a conversion started after tADC10ON is less than ±0.5 LSB. The reference and input signal are already
settled.
10-Bit ADC, Linearity Parameters(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
Integral linearity error
Differential linearity error
Offset error
TEST CONDITIONS
VCC
3 V
3 V
3 V
3 V
3 V
MIN
TYP
MAX UNIT
±1 LSB
±1 LSB
±1 LSB
±2 LSB
±5 LSB
EI
ED
EO
EG
ET
Source impedance RS < 100 Ω
Gain error
±1.1
±2
Total unadjusted error
(1) The reference buffer's offset adds to the gain, and offset, and total unadjusted error.
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