SNIS159C – AUGUST 1999 – REVISED JULY 2013
ELECTRICAL CHARACTERISTICS
(continued)
LM35
PARAMETER
TEST CONDITIONS
V
S
= 5 V, 25°C
Quiescent current
(8)
V
S
= 5 V
V
S
= 30 V, 25°C
V
S
= 30 V
Change of quiescent
current
(9)
Temperature
coefficient of
quiescent current
Minimum temperature In circuit of
I
L
= 0
for rate accuracy
Long term stability
(8)
(9)
T
J
= T
MAX
, for 1000 hours
4 V
≤
V
S
≤
30 V, 25°C
4 V
≤
V
S
≤
30 V
TYP
56
105
56.2
105.5
0.2
0.5
+0.39
2
3
+0.7
82
161
TESTED
LIMIT
(3)
80
158
DESIGN
LIMIT
(4)
LM35C, LM35D
TYP
56
91
56.2
91.5
0.2
0.5
+0.39
2
3
+0.7
µA/°C
+1.5
±0.08
+2
+1.5
±0.08
+2
°C
°C
82
141
µA
TESTED
LIMIT
(3)
80
138
µA
DESIGN
LIMIT
(4)
UNITS
(MAX.)
Quiescent current is defined in the circuit of
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating
effects can be computed by multiplying the internal dissipation by the thermal resistance.
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