SLOS580B – MAY 2008 – REVISED JULY 2008................................................................................................................................................................
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PARAMETER MEASUREMENT INFORMATION (continued)
2V
C = 0.1
m
F
V
CC1
±1%
DE
GND 1
S1
D
54
W
V
OH
or V
OL
V
CC2
C = 0.1
m
F ±1%
0.8 V
R
V
OH
or V
OL
1 kW
C
L
= 15 pF
(includes probe and
jig capacitance)
RE
GND 1
GND 2
V TEST
Figure 12. Half-Duplex Common-Mode Transient Immunity Test Circuit
2V
C = 0.1
m
F
V
CC1
±1%
DE
GND1
S1
Z
A
0.8 V
R
V
OH
or V
OL
1 kW
RE
GND 1
C
L
= 15 pF
(includes probe and
jig capacitance)
B
GND 2
1.5 V or 0V
54
W
0 V or 1.5 V
D
V
CC2
Y
C = 0.1
m
F ±1%
54
W
V
OH
or V
OL
V TEST
Figure 13. Full-Duplex Common-Mode Transient Immunity Test Circuit
8
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