TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions
-55 C +125 C
= 0 V; 4.5 V 5.5 V
unless otherwise specified
Group A
subgroups
Device
types
Limits
Max
Unit
ns
T
C
V
V
CC
SS
Min
5
01-10, 13-18,
22-27, 30-35,
44-46
Address hold after
end of write
t
t
See figure 4, as applicable
9, 10, 11
WHAX
EHAX
11,12,19-21,
28,29,36-43,
47
0
All
2/
M,D,P
9 1/
01,02,05, 06,
13,14, 22,23,
30,31
40
Data setup to end of
write
t
t
9, 10, 11
ns
DVWH
DVEH
03,07,
35
30
15,24,32
04,08, 16,25,
33,42,43
09,17, 26,34
25
20
10,11,18, 19,
27,28, 35,36
47
18
15
10
8
12,20, 29,37
21,38-40
41,44, 45,46
All
2/
M,D,P
9 1/
01-08, 13-16,
22-25, 30-33,
42, 43
35
20
Write enable to output
t
9, 10, 11
ns
WLQZ
disable
3/ 7/
09,10, 17,18,
26,27, 34,35
11,19, 28,36
12,20, 29,37
21,38-40
47
15
10
9
8
41, 44-46
All
7
2/
M,D,P
9 1/
Output active after
end of write 3/
t
See figure 4, as applicable
9, 10, 11
All
5
ns
WHQX
M,D,P
9 1/
2/
See footnotes at end of table.
SIZE
STANDARD
5962-89598
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
SHEET
L
18
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
