TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
+125 C
5.5 V
unless otherwise specified
Group A
subgroups
Device
types
Limits
Max
Unit
-55 C
T
C
V
= 0 V; 4.5 V
V
CC
Min
SS
Output hold after
address change
t
t
t
See figure 4, as applicable
M,D,P
9, 10, 11
9 1/
All
All
3
ns
ns
ns
AVQX
ELQX
EHQZ
2/
3
Chip enable to
output in low Z
3/ 7/
9, 10, 11
9 1/
M,D,P
2/
Chip disable to output
in high Z
9, 10, 11
01-08,
13-16,
22-25,
30-33,
42, 43
30
3/ 7/
09,10,
17,18,
26,27,
34,35
20
15
11,19,
28,36,
47
12,20,
29,37
10
8
21,38-
40
41,44,
45,46
7
M,D,P
M,D,P
9 1/
All
All
2/
Output enable
to output in low Z
3/ 7/
t
9, 10, 11
9 1/
0
ns
OLQX
2/
See footnotes at end of table.
SIZE
STANDARD
5962-89598
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
L
SHEET
14
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
