TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits
Min Max
Unit
C
VSS = 0 V
4.5 V ≤ V ≤ 5.5 V
CC
unless otherwise specified
01
02
03
04
05
06
07
08
120
80
65
50
40
30
20
15
CL = 30 pF,
See figures 4 and 5
9,10,11
Read pulse width
tRPW
ns
M, D
9 1/
2/
01-04
05-07
08
10
5.0
0
Read pulse low to
data bus at low Z
tRLZ
3/
CL = 30 pF,
9,10,11
See figures 4 and 5
ns
ns
M, D
9 1/
2/
01-04
06,07
05
Write pulse low to
data bus at low Z
tWLZ
CL = 30 pF,
9,10,11
5.0
10
3
3/ 4/
See figures 4 and 5
08
M, D
9 1/
2/
tDV
CL = 30 pF,
9,10,11
All
5.0
Data valid from read
pulse high
See figures 4 and 5
ns
M, D
9 1/
2/
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-89568
A
REVISION LEVEL
H
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
8
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
