Document Number: PS-MPU-6500A-01
Revision: 1.1
Release Date: 03/05/2014
MPU-6500 Product Specification
10 Reliability
10.1 Qualification Test Policy
InvenSense’s products complete a Qualification Test Plan before being released to production. The
Qualification Test Plan for the MPU-6500 followed the JESD47I Standards, “Stress-Test-Driven Qualification
of Integrated Circuits,” with the individual tests described below.
10.2 Qualification Test Plan
Accelerated Life Tests
TEST
Method/Condition
Lot
Quantity
Sample /
Lot
Acc /
Reject
Criteria
(HTOL/LFR)
High Temperature Operating Life
JEDEC JESD22-A108D, Dynamic, 3.63V biased,
Tj>125°C [read-points 168, 500, 1000 hours]
3
3
77
77
(0/1)
(HAST)
JEDEC JESD22-A118A
Condition A, 130°C, 85%RH, 33.3 psia. unbiased, [read-
point 96 hours]
(0/1)
Highly Accelerated Stress Test (1)
(HTS)
JEDEC JESD22-A103D, Cond. A, 125°C Non-Bias Bake
[read-points 168, 500, 1000 hours]
3
77
(0/1)
High Temperature Storage Life
Device Component Level Tests
Method/Condition
TEST
Lot
Quantity
Sample /
Lot
Acc /
Reject
Criteria
(ESD-HBM)
ANSI/ESDA/JEDEC JS-001-2012, (2KV)
1
3
(0/1)
ESD-Human Body Model
(ESD-MM)
ESD-Machine Model
JEDEC JESD22-A115C, (250V)
1
1
3
3
6
5
(0/1)
(0/1)
(0/1)
(LU)
Latch Up
JEDEC JESD-78D Class II (2), 125°C; ±100mA
(MS)
Mechanical Shock
JEDEC JESD22-B104C, Mil-Std-883,
Method 2002.5, Cond. E, 10,000g’s, 0.2ms,
±X, Y, Z – 6 directions, 5 times/direction
(VIB)
Vibration
JEDEC JESD22-B103B, Variable Frequency (random),
Cond. B, 5-500Hz,
X, Y, Z – 4 times/direction
3
3
5
(0/1)
(0/1)
(TC)
JEDEC JESD22-A104D
Condition G [-40°C to +125°C],
Soak Mode 2 [5’], 1000 cycles
77
Temperature Cycling (1)
(1) Tests are preceded by MSL3 Preconditioning in accordance with JEDEC JESD22-A113F
39 of 40
TDK [ TDK ELECTRONICS ]
