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TSL2301 参数 Datasheet PDF下载

TSL2301图片预览
型号: TSL2301
PDF下载: 下载PDF文件 查看货源
内容描述: 102 X 1线性的模拟? TO光学传感器阵列?数字转换器 [102 X 1 LINEAR OPTICAL SENSOR ARRAY WITH ANALOGTODIGITAL CONVERTER]
分类和应用: 转换器传感器
文件页数/大小: 12 页 / 130 K
品牌: TAOS [ TEXAS ADVANCED OPTOELECTRONIC SOLUTIONS ]
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TSL2301
102
×
1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG TO DIGITAL CONVERTER
TAOS007 – JULY 2000
Optical Array Characteristics (single-die) at V
DD
= 5 V, T
A
= 25°C,
λ
p
= 590 nm, t
int
= 200
µs
(unless
otherwise noted) Ee=??????
PARAMETER
DSNU
PRNU
Dark signal non uniformity
non-uniformity
Photo-response non-uniformity
Dark-level effective illumination (measure of dark
current)
TEST CONDITIONS
Gain register = 00000b,
Gain register = 11111b,
See Notes 3 and 4
T
A
= 70°C
See Note 2
See Note 2
±4%
TBD
MIN
TYP
5
MAX
10
14
±5%
nJ/cm
2
LSB
UNIT
NOTES: 2. DSNU is the difference between the highest value pixel and the lowest value pixel of the device under test when the array is not
illuminated.
3. PRNU does not include DSNU.
4. PRNU is the difference between the highest value pixel and the lowest value pixel of the device under test when the array is uniformly
illuminated at nominal white level (typical average output level = 200).
Switching Characteristics over recommended operating range (unless otherwise noted)
PARAMETER
f
max
t
w(CLKH)
t
w(CLKL)
t
su
t
h
t
r
t
r
t
d
C
i
Maximum clock frequency
Clock high pulse duration
Clock low pulse duration
Input setup time
Input hold time
Rise time, output
Fall time, output
Delay from clock edge to data-out stable
Input pin capacitance
C
L
= 20 pF
TEST CONDITIONS
MIN
10
30
30
20
20
10
10
20
10
TBD
TYP
MAX
UNIT
MHz
ns
ns
ns
ns
ns
ns
ns
pF
Light-to-Digital Transfer Characteristics at V
DD
= 5 V, T
A
= 25°C,
λ
p
= 590 nm, t
int
= 200
µs
(unless
otherwise noted) E
e
=???????
PARAMETER
A-to-D converter resolution
Gain register = 00000b
Full-scale
Full scale reference
Gain register = 11111b
For converter only, does not include
photodiode characteristics
Offset register = 00000000b
Offset register = 00000000b
0
TBD
170
TBD
5
TEST CONDITIONS
MIN
TYP
8
6.3
2.1
±150
17
TBD
200
TBD
±64
Gain register = 00000b
Programmable offset step size
Dark-level change with temperature
Differential nonlinearity
Integral nonlinearity
Gain register = 00000b
Dark level noise
Power supply rejection ratio
Gain register = 11111b
Gain register = 11111b
0°C < T
A
< 70°C
0.5
1.5
2
±0.5
±1
0.5
1.5
TBD
LSB
dB
LSB
LSB
LSB
LSB
30
TBD
230
TBD
LSB
LSB
7.6
MAX
UNIT
Bits
nJ/cm
2
ppm/°C
Full-scale reference temperature sensitivity
Gain register = 00000b
Average dark level
dark-level
Average white level output
Programmable offset steps
Gain register = 11111b
Gain register = 00000b
Gain register = 11111b
www.taosinc.com
t
Copyright
E
2000, TAOS Inc.
t
5