SLOS488B – NOVEMBER 2006 – REVISED FEBRUARY 2008
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
FUNCTIONAL BLOCK DIAGRAM
LEFTINM
Left
LEFTINP
HPLEFT
Gain
Control
De-Pop
RIGHTINM
Right
RIGHTINP
HPRIGHT
Thermal
Current
Limit
CPP
CPN
CPVSS
Charge
Pump
Power
Management
I2C Interface
and Control
SD
SDA
SCL
VDD
GND
VDD
GND
Headphone channels are independently enabled and muted. The I
2
C interface controls channel gain, device
modes, and charge pump activation. The charge pump generates a negative supply voltage for the output
amplifiers. This allows a 0 V bias at the outputs, eliminating the need for bulky output capacitors. The thermal
block detects faults and shuts down the device before damage occurs. The I
2
C register records thermal fault
conditions. The current limit block prevents the output current from getting high enough to damage the device.
The De-Pop block eliminates audible pops during power-up, power-down, and amplifier enable and disable
events.
2
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