Electrical specifications
VN5010AK-E
Table 8.
Symbol
Logic input
Parameter
Test conditions
Min. Typ. Max. Unit
VIL
IIL
Input low level voltage
Low level input current
Input high level voltage
High level input current
0.9
V
µA
V
VIN= 0.9V
VIN= 2.1V
1
VIH
IIH
2.1
10
µA
V
VI(hyst) Input hysteresis voltage
VICL Input clamp voltage
0.25
5.5
IIN= 1mA
IIN= -1mA
7
V
V
-0.7
VCSDL CS_DIS low level voltage
ICSDL Low level CS_DIS current
VCSDH CS_DIS high level voltage
ICSDH High level CS_DIS current
0.9
V
µA
V
VCSD= 0.9V
VCSD= 2.1V
1
2.1
10
7
µA
V
VCSD(hyst) CS_DIS hysteresis voltage
0.25
5.5
I
CSD= 1mA
V
V
VCSCL CS_DIS clamp voltage
ICSD= -1mA
-0.7
(1)
Table 9.
Symbol
Protections and diagnostics
Parameter
Test conditions
Min.
Typ.
Max. Unit
V
CC= 13V
46
65
91
91
A
A
IlimH
Short circuit current
5V<VCC<36V
VCC= 13V;
Short circuit current during
thermal cycling
IlimL
24
A
TR<Tj<TTSD
TTSD Shutdown temperature
150
175
200
°C
°C
°C
°C
TR
Reset temperature
TRS+1 TRS+5
TRS
Thermal reset of STATUS
135
THYST Thermal hysteresis (TTSD-TR)
VDEMAG Turn-Off output voltage clamp IOUT=2A; VIN=0; L=6mH
7
VCC
-41
VCC
-46
VCC
-52
V
Output voltage drop
limitation
IOUT=0.5A (see Figure 9.);
VON
25
mV
Tj= -40°C...+150°C
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
10/31
STMICROELECTRONICS [ ST ]
