STM32F105xx, STM32F107xx
Description
2.3.24
Remap capability
This feature allows the use of a maximum number of peripherals in a given application.
Indeed, alternate functions are available not only on the default pins but also on other
specific pins onto which they are remappable. This has the advantage of making board
design and port usage much more flexible.
For details refer to Table 5: Pin definitions; it shows the list of remappable alternate functions
and the pins onto which they can be remapped. See the STM32F10xxx reference manual
for software considerations.
2.3.25
ADCs (analog-to-digital converters)
Two 12-bit analog-to-digital converters are embedded into STM32F105xx and
STM32F107xx connectivity line devices and each ADC shares up to 16 external channels,
performing conversions in single-shot or scan modes. In scan mode, automatic conversion
is performed on a selected group of analog inputs.
Additional logic functions embedded in the ADC interface allow:
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Simultaneous sample and hold
Interleaved sample and hold
Single shunt
The ADC can be served by the DMA controller.
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all selected channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the standard timers (TIMx) and the advanced-control timer (TIM1)
can be internally connected to the ADC start trigger and injection trigger, respectively, to
allow the application to synchronize A/D conversion and timers.
2.3.26
DAC (digital-to-analog converter)
The two 12-bit buffered DAC channels can be used to convert two digital signals into two
analog voltage signal outputs. The chosen design structure is composed of integrated
resistor strings and an amplifier in inverting configuration.
This dual digital Interface supports the following features:
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two DAC converters: one for each output channel
8-bit or 12-bit monotonic output
left or right data alignment in 12-bit mode
synchronized update capability
noise-wave generation
triangular-wave generation
dual DAC channel independent or simultaneous conversions
DMA capability for each channel
external triggers for conversion
input voltage reference V
REF+
Doc ID 15274 Rev 6
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