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STM32F103RCT7 参数 Datasheet PDF下载

STM32F103RCT7图片预览
型号: STM32F103RCT7
PDF下载: 下载PDF文件 查看货源
内容描述: 高密度高性能线的基于ARM的32位MCU,具有256至512KB闪存, USB , CAN ,11个定时器, 3的ADC ,13个通信接口 [High-density performance line ARM-based 32-bit MCU with 256 to 512KB Flash, USB, CAN, 11 timers, 3 ADCs, 13 communication interfaces]
分类和应用: 闪存通信
文件页数/大小: 130 页 / 1933 K
品牌: STMICROELECTRONICS [ STMICROELECTRONICS ]
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STM32F103xC, STM32F103xD, STM32F103xE
Electrical characteristics
5.3.11
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the
device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
Electrostatic discharge (ESD)
(positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
FTB:
A Burst of Fast Transient voltage (positive and negative) is applied to V
DD
and
V
SS
through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in
They are based on the EMS levels and classes
defined in application note AN1709.
Table 41.
Symbol
EMS characteristics
Parameter
Conditions
Level/
Class
2B
V
FESD
V
DD
=
3.3 V, LQFP144, T
A
=
+25 °C,
Voltage limits to be applied on any I/O pin to
f
HCLK
=
72 MHz
induce a functional disturbance
conforms to IEC 61000-4-2
Fast transient voltage burst limits to be
applied through 100 pF on V
DD
and V
SS
pins to induce a functional disturbance
V
DD
=
3.3 V, LQFP144, T
A
=
+25 °C,
f
HCLK
=
72 MHz
conforms to IEC 61000-4-4
V
EFTB
4A
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
Doc ID 14611 Rev 8
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