STM32F103xx
Electrical characteristics
5.3.6
External clock source characteristics
High-speed external user clock
The characteristics given in
result from tests performed using an high-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in
Table 15.
Symbol
f
HSE_ext
V
HSEH
V
HSEL
t
w(HSE)
t
w(HSE)
t
r(HSE)
t
f(HSE)
I
L
High-speed external (HSE) user clock characteristics
Parameter
User external clock source
frequency
(1)
OSC_IN input pin high level
voltage
OSC_IN input pin low level
voltage
OSC_IN high or low time
(1)
OSC_IN rise or fall time
(1)
OSC_IN Input leakage
current
V
SS
≤V
IN
≤V
DD
0.7V
DD
V
SS
16
ns
5
±1
µA
Conditions
Min
Typ
8
Max
25
V
DD
V
0.3V
DD
Unit
MHz
1. Value based on design simulation and/or technology characteristics. It is not tested in production.
Low-speed external user clock
The characteristics given in
result from tests performed using an low-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in
Table 16.
Symbol
f
LSE_ext
V
LSEH
V
LSEL
t
w(LSE)
t
w(LSE)
t
r(LSE)
t
f(LSE)
I
L
Low-speed external user clock characteristics
Parameter
User External clock source
frequency
(1)
OSC32_IN input pin high level
voltage
OSC32_IN input pin low level
voltage
OSC32_IN high or low time
(1)
OSC32_IN rise or fall time
(1)
OSC32_IN Input leakage
current
V
SS
≤V
IN
≤V
DD
0.7V
DD
V
SS
450
ns
5
±1
µA
Conditions
Min
Typ
32.768
Max
1000
V
DD
V
0.3V
DD
Unit
kHz
1. Value based on design simulation and/or technology characteristics. It is not tested in production.
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