ST6208C/ST6209C/ST6210C/ST6220C
10.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
■ ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
10.7.1 Functional EMS
(Electro Magnetic Susceptibility)
■ FTB: A Burst of Fast Transient voltage (positive
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
and negative) is applied to V and V through
DD
SS
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
A device reset allows normal operations to be re-
sumed.
1)
1)
Symbol
Parameter
Conditions
=5V, T =+25°C, f
conforms to IEC 1000-4-2
Neg
Pos
Unit
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
V
=8MHz
OSC
DD
A
V
-2
2
FESD
kV
Fast transient voltage burst limits to be ap-
V
=5V, T =+25°C, f
=8MHz
OSC
DD
A
V
plied through 100pF on V and V pins
-2.5
3
FFTB
DD
DD
conforms to IEC 1000-4-4
to induce a functional disturbance
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10 µF and 0.1 µF decoupling capacitors on the power supply lines are proposed as a good price vs.
EMC performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC rec-
ommendations are given in other sections (I/Os, RESET, OSCx pin characteristics).
2)
Figure 56. EMC Recommended Star Network Power Supply Connection
ST62XX
V
DD
10 µF 0.1 µF
V
V
DD
SS
ST6
POWER
SUPPLY
SOURCE
DIGITAL NOISE
FILTERING
(close to the MCU)
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STMICROELECTRONICS [ ST ]
