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M95640-WMN6TP/P 参数 Datasheet PDF下载

M95640-WMN6TP/P图片预览
型号: M95640-WMN6TP/P
PDF下载: 下载PDF文件 查看货源
内容描述: [8KX8 SPI BUS SERIAL EEPROM, PDSO8, 0.169 INCH, HALOGEN FREE AND ROHS COMPLIANT, PLASTIC, TSSOP-8]
分类和应用: 可编程只读存储器电动程控只读存储器电可擦编程只读存储器时钟光电二极管内存集成电路
文件页数/大小: 47 页 / 620 K
品牌: STMICROELECTRONICS [ ST ]
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DC and AC parameters  
M95640-W M95640-R M95640-DF  
Table 20. AC characteristics (M95640-R, device grade 6)  
Test conditions specified in Table 10 and Table 12  
Previous  
New products(2)  
products(1)  
Symbol Alt.  
Parameter  
Unit  
VCC 1.8V  
VCC 1.8V VCC 2.5V VCC 4.5V  
Min. Max. Min. Max. Min. Max. Min. Max.  
fC  
fSCK Clock frequency  
2
5
10  
20 MHz  
tSLCH tCSS1 S active setup time  
150  
150  
200  
150  
150  
200  
200  
60  
60  
90  
60  
60  
80  
80  
30  
30  
40  
30  
30  
40  
40  
15  
15  
20  
15  
15  
20  
20  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tSHCH tCSS2 S not active setup time  
tSHSL  
tCHSH tCSH S active hold time  
tCS S deselect time  
tCHSL  
S not active hold time  
tCLH Clock high time  
(3)  
tCH  
(3)  
tCL  
tCLL Clock low time  
tRC Clock rise time  
tFC Clock fall time  
(4)  
tCLCH  
2
2
2
2
2
2
2
2
µs  
µs  
ns  
ns  
(4)  
tCHCL  
tDVCH tDSU Data in setup time  
tCHDX tDH Data in hold time  
Clock low hold time after HOLD  
50  
50  
20  
20  
10  
10  
5
10  
tHHCH  
150  
150  
0
60  
60  
0
30  
30  
0
15  
15  
0
ns  
ns  
ns  
ns  
not active  
Clock low hold time after HOLD  
active  
tHLCH  
tCLHL  
tCLHH  
Clock low setup time before  
HOLD active  
Clock low setup time before  
HOLD not active  
0
0
0
0
(4)  
tSHQZ  
tCLQV  
tCLQX  
tDIS Output disable time  
tV Clock low to output valid  
tHO Output hold time  
200  
200  
80  
80  
40  
40  
20  
20  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
0
0
0
0
(4)  
tQLQH  
tRO Output rise time  
200  
200  
200  
200  
5
80  
80  
80  
80  
5
20  
20  
40  
40  
5
10  
10  
20  
20  
5
(4)  
tQHQL  
tFO Output fall time  
tHHQV  
tLZ HOLD high to output valid  
tHZ HOLD low to output High-Z  
tWC Write time  
(4)  
tHLQZ  
tW  
1. For devices identified by process letter P.  
2. For devices identified by process letter K.  
3. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max).  
4. Characterized only, not tested in production.  
38/47  
Doc ID 16877 Rev 16  
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