M25PE10, M25PE20
Table 13. AC Characteristics (25MHz operation)
Test conditions specified in Table 9. and Table 10.
Symbol
Alt.
Parameter
Min.
Typ.
Max.
Unit
Clock Frequency for the following
instructions: FAST_READ, PW, PP,
PE, SE, DP, RDP, WREN, WRDI,
RDSR
f
f
D.C.
25
MHz
C
C
Clock Frequency for READ
instructions
f
D.C.
20
MHz
R
(1)
t
Clock High Time
Clock Low Time
18
18
ns
ns
t
CLH
CH
(1)
t
t
CLL
CL
2
0.1
10
10
5
V/ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
Clock Slew Rate (peak to peak)
t
t
t
t
t
S Active Setup Time (relative to C)
S Not Active Hold Time (relative to C)
Data In Setup Time
SLCH
CHSL
CSS
DVCH
CHDX
CHSH
SHCH
DSU
t
t
t
t
Data In Hold Time
5
DH
S Active Hold Time (relative to C)
S Not Active Setup Time (relative to C)
S Deselect Time
10
10
200
t
t
CSH
SHSL
(2)
t
Output Disable Time
15
15
t
DIS
SHQZ
t
t
V
Clock Low to Output Valid
Output Hold Time
CLQV
t
t
HO
0
CLQX
t
t
Top Sector Lock Setup Time
Top Sector Lock Hold Time
S to Deep Power-down
50
THSL
100
SHTL
(2)
3
t
DP
(2)
(3)
S High to Standby Power Mode
30
µs
t
RDP
Page Write Cycle Time (256 Bytes)
11
25
5
ms
t
PW
10.2 +
n*0.8/256
Page Write Cycle Time (n Bytes)
Page Program Cycle Time (256 Bytes)
Page Program Cycle Time (n Bytes)
1.2
(3)
ms
t
PP
0.4 +
n*0.8/256
t
Page Erase Cycle Time
Sector Erase Cycle Time
10
1
20
5
ms
s
PE
t
SE
Note: 1. t + t must be greater than or equal to 1/ f
C
CH
CL
2. Value guaranteed by characterization, not 100% tested in production.
3. When using PP and PW instructions to update consecutive Bytes, optimized timings are obtained with one sequence including all
the Bytes versus several sequences of only a few Bytes. (1 ≤n ≤256)
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STMICROELECTRONICS [ ST ]
