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SGA-8343X 参数 Datasheet PDF下载

SGA-8343X图片预览
型号: SGA-8343X
PDF下载: 下载PDF文件 查看货源
内容描述: 可靠性鉴定报告 [Reliability Qualification Report]
分类和应用: 晶体晶体管开关光电二极管
文件页数/大小: 9 页 / 179 K
品牌: STANFORD [ STANFORD MICRODEVICES ]
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SGA-8343X Reliability Qualification Report
VIIII. Electrostatic Discharge Classification
Sirenza Microdevices classifies Human Body Model (HBM) electrostatic discharge (ESD)
according to the JESD22-A114 convention. All pin pair combinations were tested. Each
pin pair is stressed at one static voltage level using 1 positive and 1 negative pulse
polarity to determine the weakest pin pair combination. The weakest pin pair is tested
with 3 devices below and above the failure voltage to classify the part. The Pass/Fail
status of a part is determined by the manufacturing test specification. The ESD class
quoted indicates that the device passed exposure to a certain voltage, but does not pass
the next higher level. The following table indicates the JESD ESD sensitivity
classification levels. The results of the testing indicate that SGA-8343X’s HBM ESD
rating is Class 1B.
Class
0
1A
1B
1C
2
Passes
0V
250 V
500 V
1000 V
2000 V
Fails
<250 V
500 V
1000 V
2000 V
4000 V
X. Operational Life Test Results
The results for SGA-8343X High Temperature Operating Life Test are as follows:
HTOL Completion
Date
Mar-04
Test
Duration
1000
hours
Junction
Temperature
150°C
Quantity
80
Device Hours
80,000
Table 1: Summary of High Temperature Operational Life Test Cumulative Device Hours
XI. Qualification Test Results for SGA-8343X
Initial Qualification Date – March, 2004
Group A0
Test Conditions
Number of
Devices Under
Test
Moisture preconditioning and three reflow cycles
Temperature = 270°C Peak, Slope < 6°C/second
145
Test
Standard
JESD22-
A113(C)
Results
PASS