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SGA-8343X 参数 Datasheet PDF下载

SGA-8343X图片预览
型号: SGA-8343X
PDF下载: 下载PDF文件 查看货源
内容描述: 可靠性鉴定报告 [Reliability Qualification Report]
分类和应用: 晶体晶体管开关光电二极管
文件页数/大小: 9 页 / 179 K
品牌: STANFORD [ STANFORD MICRODEVICES ]
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SGA-8343X Reliability Qualification Report  
VIIII. Electrostatic Discharge Classification  
Sirenza Microdevices classifies Human Body Model (HBM) electrostatic discharge (ESD)  
according to the JESD22-A114 convention. All pin pair combinations were tested. Each  
pin pair is stressed at one static voltage level using 1 positive and 1 negative pulse  
polarity to determine the weakest pin pair combination. The weakest pin pair is tested  
with 3 devices below and above the failure voltage to classify the part. The Pass/Fail  
status of a part is determined by the manufacturing test specification. The ESD class  
quoted indicates that the device passed exposure to a certain voltage, but does not pass  
the next higher level. The following table indicates the JESD ESD sensitivity  
classification levels. The results of the testing indicate that SGA-8343X’s HBM ESD  
rating is Class 1B.  
Class  
Passes  
Fails  
0
0 V  
<250 V  
500 V  
1000 V  
2000 V  
4000 V  
1A  
1B  
1C  
2
250 V  
500 V  
1000 V  
2000 V  
X. Operational Life Test Results  
The results for SGA-8343X High Temperature Operating Life Test are as follows:  
HTOL Completion  
Date  
Test  
Duration  
Junction  
Temperature  
Quantity  
80  
Device Hours  
80,000  
Mar-04  
1000  
150°C  
hours  
Table 1: Summary of High Temperature Operational Life Test Cumulative Device Hours  
XI. Qualification Test Results for SGA-8343X  
Initial Qualification Date – March, 2004  
Group A0  
Moisture preconditioning and three reflow cycles  
Test Conditions  
Temperature = 270°C Peak, Slope < 6°C/second  
Number of  
Devices Under  
Test  
145  
Test  
Standard  
JESD22-  
A113(C)  
Results  
PASS  
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