16 Mbit Concurrent SuperFlash + 2 / 4 Mbit SRAM ComboMemory
SST34HF1621 / SST34HF1641
Data Sheet
V
IHT
V
V
INPUT
REFERENCE POINTS
OUTPUT
OT
IT
V
ILT
523 ILL F19.0
AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points
for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
V
ILT - VINPUT LOW Test
FIGURE 19: AC INPUT/OUTPUT REFERENCE WAVEFORMS
TO TESTER
TO DUT
C
L
523 ILL F20.0
FIGURE 20: A TEST LOAD EXAMPLE
©2001 Silicon Storage Technology, Inc.
S71172-05-000 10/01 523
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