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S29AL004D70MFI013 参数 Datasheet PDF下载

S29AL004D70MFI013图片预览
型号: S29AL004D70MFI013
PDF下载: 下载PDF文件 查看货源
内容描述: 4兆位( 512 Kx的8位/ 256千×16位) CMOS 3.0伏只引导扇区闪存 [4 Megabit (512 Kx 8-Bit/256 K x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory]
分类和应用: 闪存
文件页数/大小: 55 页 / 1488 K
品牌: SPANSION [ SPANSION ]
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A d v a n c e I n f o r m a t i o n  
content occurs during the power transition. No command is necessary in this  
mode to obtain array data. Standard microprocessor read cycles that assert valid  
addresses on the device address inputs produce valid data on the device data  
outputs. The device remains enabled for read access until the command register  
contents are altered.  
See Reading Array Data‚ on page 18 for more information. Refer to the AC table  
for timing specifications and to Figure 13, on page 37 for the timing diagram. I  
CC1  
in the DC Characteristics table represents the active current specification for  
reading array data.  
Writing Commands/Command Sequences  
To write a command or command sequence (which includes programming data  
to the device and erasing sectors of memory), the system must drive WE# and  
CE# to V , and OE# to V .  
IL  
IH  
For program operations, the BYTE# pin determines whether the device accepts  
program data in bytes or words. Refer to Word/Byte Configuration‚ on page 11  
for more information.  
The device features an Unlock Bypass mode to facilitate faster programming.  
Once the device enters the Unlock Bypass mode, only two write cycles are re-  
quired to program a word or byte, instead of four. The Word/Byte Program  
Command Sequence‚ on page 19 has details on programming data to the device  
using both standard and Unlock Bypass command sequences.  
An erase operation can erase one sector, multiple sectors, or the entire device.  
Table 2 on page 13 and Table on page 14 indicate the address space that each  
sector occupies. A sector address consists of the address bits required to uniquely  
select a sector. The Command Definitions‚ on page 18 has details on erasing a  
sector or the entire chip, or suspending/resuming the erase operation.  
After the system writes the autoselect command sequence, the device enters the  
autoselect mode. The system can then read autoselect codes from the internal  
register (which is separate from the memory array) on DQ7–DQ0. Standard read  
cycle timings apply in this mode. Refer to the Autoselect Mode‚ on page 14 and  
Autoselect Command Sequence‚ on page 19 for more information.  
I
in the DC Characteristics table represents the active current specification for  
CC2  
the write mode. The AC Characteristics‚ on page 37 contains timing specification  
tables and timing diagrams for write operations.  
Program and Erase Operation Status  
During an erase or program operation, the system may check the status of the  
operation by reading the status bits on DQ7–DQ0. Standard read cycle timings  
and I read specifications apply. Refer to Write Operation Status‚ on page 26 for  
CC  
more information, and to AC Characteristics‚ on page 37 for timing diagrams.  
Standby Mode  
When the system is not reading or writing to the device, it can place the device  
in the standby mode. In this mode, current consumption is greatly reduced, and  
the outputs are placed in the high impedance state, independent of the OE#  
input.  
The device enters the CMOS standby mode when the CE# and RESET# pins are  
both held at V  
0.3 V. (Note that this is a more restricted voltage range than  
CC  
V .) If CE# and RESET# are held at V , but not within V  
CC  
0.3 V, the device  
S29AL004D_00_A1 February 18, 2005  
IH  
IH  
12  
S29AL004D  
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