CXD3017Q
1-bit DAC and LPF Block Analog Characteristics
Analog characteristics (VDD = AVDD = 3.3V, VSS = AVSS = 0V, Ta = 25°C)
Max.
Unit
%
Item
Symbol
THD
Crystal
384Fs
768Fs
384Fs
768Fs
Min.
Typ.
Conditions
1kHz, 0dB data
0.0080 0.0120
0.0080 0.0120
102
Total harmonic
distortion
98
98
Signal-to-noise
ratio
1kHz, 0dB data when AMUT ON
(Using A-weighting filter)
S/N
dB
102
Fs = 44.1kHz in all cases.
The total harmonic distortion and signal-to-noise ratio measurement circuits are shown below.
Note) The external load capacitance connect to the LPF block should be 30pF or less in total.
27k
AOUT1 (2)
330pF
27k
27k
SHIBASOKU (AM51A)
Audio Analyzer
AIN1 (2)
68pF
LOUT1 (2)
22µ
100k
LPF external circuit diagram
768Fs/384Fs
Rch
Lch
A
B
DATA
RF
Audio Analyzer
TEST DISC
CXD3017Q
Block diagram of analog characteristics measurement
(VDD = AVDD = 3.3V, VSS = AVSS = 0V, Topr = –20 to +75°C)
Item
Output voltage
Load resistance
Load capacitance
Symbol
VOUT
RL
Applicable pins
Max.
Unit
Vrms
kΩ
Min.
Typ.
0.71
1
1
20
,
1
2
30
pF
CL
Measurement is conducted for the LPF external circuit diagram with the sine wave output of 1kHz and 0dB.
Applicable pins
1 LOUT1, LOUT2
2 AOUT1, AOUT2
– 11 –
SONY [ SONY CORPORATION ]
